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- 2020
-
Mark
X-ray Imaging at High Brilliance Sources
- Master (Two yrs)
- 2019
-
Mark
Finite element modelling of strained nanowire heterostructures
- Bach. Degree
- 2018
-
Mark
The development of scanning X-ray diffraction phase mapping techniques using automated Rietveld refinements.
- Master (Two yrs)
- 2016
-
Mark
Heat transport in nano materials subject to high intensity nano focused X-rays
- Bach. Degree
- 2011
-
Mark
Characterization of doped GaInP nanowires for photovoltaics
- Master (One yr)
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