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Proton-Induced X-Ray Analysis of Steel Surfaces for Microprobe Purposes

Ahlberg, Mats; Akselsson, Roland LU ; Brune, Dag and Lorenzen, Joachim (1975) In Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment 123(2). p.385-393
Abstract
A study of the detection limits for the elements with Z = 15-92 in thick target steel surfaces using proton-induced X-ray technique has been performed.

Samples were irradiated with a broad proton beam of 2 mm diameter and the X-rays were detected by a Si(Li) detector. Detection limits at levels down to the order of 10 ppm were achieved with simultaneous measurement of several elements.

Mylar and chromium absorbers were introduced in front of the semiconductor detector and irradiations at two different proton energies (1.0 and 2.5 MeV) were carried out in order to elucidate their effects on detection limits. The results are valid for microbeam analysis.
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
steel surface analysis, PIXE, microprobe
in
Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
volume
123
issue
2
pages
385 - 393
publisher
Elsevier
external identifiers
  • Scopus:0016441468
ISSN
0167-5087
DOI
10.1016/0029-554X(75)90022-1
language
English
LU publication?
yes
id
a565d454-d347-42e0-afa2-4229a9800226 (old id 1734594)
date added to LUP
2010-12-02 13:46:43
date last changed
2016-10-13 04:44:30
@misc{a565d454-d347-42e0-afa2-4229a9800226,
  abstract     = {A study of the detection limits for the elements with Z = 15-92 in thick target steel surfaces using proton-induced X-ray technique has been performed. <br/><br>
Samples were irradiated with a broad proton beam of 2 mm diameter and the X-rays were detected by a Si(Li) detector. Detection limits at levels down to the order of 10 ppm were achieved with simultaneous measurement of several elements. <br/><br>
Mylar and chromium absorbers were introduced in front of the semiconductor detector and irradiations at two different proton energies (1.0 and 2.5 MeV) were carried out in order to elucidate their effects on detection limits. The results are valid for microbeam analysis.},
  author       = {Ahlberg, Mats and Akselsson, Roland and Brune, Dag and Lorenzen, Joachim},
  issn         = {0167-5087},
  keyword      = {steel surface analysis,PIXE,microprobe},
  language     = {eng},
  number       = {2},
  pages        = {385--393},
  publisher    = {ARRAY(0x97a8548)},
  series       = {Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment},
  title        = {Proton-Induced X-Ray Analysis of Steel Surfaces for Microprobe Purposes},
  url          = {http://dx.doi.org/10.1016/0029-554X(75)90022-1},
  volume       = {123},
  year         = {1975},
}