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Accessing On-chip Instruments Through the Life-time of Systems

Larsson, Erik LU and Ghani Zadegan, Farrokh LU (2016) LATS 2016 17th IEEE Latin-American Test Symposium In 2016 17th Latin-American Test Symposium (LATS) p.2-4
Abstract (Swedish)

Abstract—The electronic systems we find in almost every product today are implemented using integrated circuits (ICs) mounted on printed circuit boards (PCBs). Developing electronic systems is a challenging task due to complexity and miniatur- ization. A single IC can contain billions of transistors, which are smaller than ever. As a result more Design-for-Test (DfT) features, so called instruments, are embedded on-chip in modern ICs to handle and monitor various activities. Many defects are handled at IC manufacturing; however, there are many problems occurring after ICs are being mounted on PCBs. In many cases, it is unfortunately not possible to reproduce the problem when the electronic system is taken to a repair shop. These... (More)

Abstract—The electronic systems we find in almost every product today are implemented using integrated circuits (ICs) mounted on printed circuit boards (PCBs). Developing electronic systems is a challenging task due to complexity and miniatur- ization. A single IC can contain billions of transistors, which are smaller than ever. As a result more Design-for-Test (DfT) features, so called instruments, are embedded on-chip in modern ICs to handle and monitor various activities. Many defects are handled at IC manufacturing; however, there are many problems occurring after ICs are being mounted on PCBs. In many cases, it is unfortunately not possible to reproduce the problem when the electronic system is taken to a repair shop. These problems are known as No Trouble Found (NTF). One obstacle is the limited access to the on-chip DfT instruments that exist in most ICs. We will discuss access to on-chip DfT instruments through the life- time of electronic systems. We will focus on electronic systems using the IEEE 1687 standard. (Less)
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author
organization
alternative title
Accessing On-chip Instruments Through the Life-time of Systems
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
in press
subject
in
2016 17th Latin-American Test Symposium (LATS)
pages
3 pages
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
LATS 2016 17th IEEE Latin-American Test Symposium
language
English
LU publication?
yes
id
20acf3d7-0280-47ec-bc50-194a77af51b3
date added to LUP
2016-04-11 12:20:12
date last changed
2016-04-14 09:35:29
@misc{20acf3d7-0280-47ec-bc50-194a77af51b3,
  abstract     = {<br/>Abstract—The electronic systems we find in almost every product today are implemented using integrated circuits (ICs) mounted on printed circuit boards (PCBs). Developing electronic systems is a challenging task due to complexity and miniatur- ization. A single IC can contain billions of transistors, which are smaller than ever. As a result more Design-for-Test (DfT) features, so called instruments, are embedded on-chip in modern ICs to handle and monitor various activities. Many defects are handled at IC manufacturing; however, there are many problems occurring after ICs are being mounted on PCBs. In many cases, it is unfortunately not possible to reproduce the problem when the electronic system is taken to a repair shop. These problems are known as No Trouble Found (NTF). One obstacle is the limited access to the on-chip DfT instruments that exist in most ICs. We will discuss access to on-chip DfT instruments through the life- time of electronic systems. We will focus on electronic systems using the IEEE 1687 standard.},
  author       = {Larsson, Erik and Ghani Zadegan, Farrokh},
  language     = {eng},
  month        = {04},
  pages        = {2--4},
  publisher    = {ARRAY(0x963dfd8)},
  series       = {2016 17th Latin-American Test Symposium (LATS) },
  title        = {Accessing On-chip Instruments Through the Life-time of Systems},
  year         = {2016},
}