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A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing

Larsson, Anders; Larsson, Erik LU ; Eles, Petru Ion and Peng, Zebo (2007) IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2007 In [Host publication title missing] p.61-61
Abstract
The increasingcost for System-on-Chip (SOC) testing is mainly due to the hugetest data volumes that lead to long test application time andrequire large automatic test equipment (ATE) memory. Testcompression and test sharing have been proposed to reduce the testdata volume, while test infrastructure and concurrent testscheduling have been developed to reduce the test application time.In this work we propose an integrated test scheduling and testinfrastructure design approach that utilizes both test compressionand test sharing as basic mechanisms to reduce test data volumes.In particular, we have developed a heuristic to minimize the testapplication time, considering different alternatives of testcompression and sharing, without violating a... (More)
The increasingcost for System-on-Chip (SOC) testing is mainly due to the hugetest data volumes that lead to long test application time andrequire large automatic test equipment (ATE) memory. Testcompression and test sharing have been proposed to reduce the testdata volume, while test infrastructure and concurrent testscheduling have been developed to reduce the test application time.In this work we propose an integrated test scheduling and testinfrastructure design approach that utilizes both test compressionand test sharing as basic mechanisms to reduce test data volumes.In particular, we have developed a heuristic to minimize the testapplication time, considering different alternatives of testcompression and sharing, without violating a given ATE memoryconstraint. The results from the proposed Tabu Search basedheuristic have been validated using benchmark designs and arecompared with optimal solutions. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
testing, system-on-chip, memory reduction, test scheduling, test data compression, test sharing, tabu search
in
[Host publication title missing]
pages
61 - 61
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2007
external identifiers
  • Scopus:46449124284
ISBN
1-4244-1162-9
DOI
10.1109/DDECS.2007.4295255
language
English
LU publication?
no
id
bf150b02-a621-456c-a8c9-db51e5d97edb (old id 2341003)
date added to LUP
2012-02-10 13:40:48
date last changed
2016-10-13 04:42:15
@misc{bf150b02-a621-456c-a8c9-db51e5d97edb,
  abstract     = {The increasingcost for System-on-Chip (SOC) testing is mainly due to the hugetest data volumes that lead to long test application time andrequire large automatic test equipment (ATE) memory. Testcompression and test sharing have been proposed to reduce the testdata volume, while test infrastructure and concurrent testscheduling have been developed to reduce the test application time.In this work we propose an integrated test scheduling and testinfrastructure design approach that utilizes both test compressionand test sharing as basic mechanisms to reduce test data volumes.In particular, we have developed a heuristic to minimize the testapplication time, considering different alternatives of testcompression and sharing, without violating a given ATE memoryconstraint. The results from the proposed Tabu Search basedheuristic have been validated using benchmark designs and arecompared with optimal solutions.},
  author       = {Larsson, Anders and Larsson, Erik and Eles, Petru Ion and Peng, Zebo},
  isbn         = {1-4244-1162-9},
  keyword      = {testing,system-on-chip,memory reduction,test scheduling,test data compression,test sharing,tabu search},
  language     = {eng},
  pages        = {61--61},
  publisher    = {ARRAY(0xb7d5010)},
  series       = {[Host publication title missing]},
  title        = {A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing},
  url          = {http://dx.doi.org/10.1109/DDECS.2007.4295255},
  year         = {2007},
}