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Fabrication and modeling of a combined gold nanoparticle-carbon nanotube single electron transistor

Thelander, Claes LU ; Magnusson, Martin LU ; Deppert, Knut LU ; Samuelson, Lars LU ; Poulsen, P.R.; Nygard, J. and Borggreen, J. (2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21) In 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science
Abstract
Scanning probe manipulation has been used to electrically connect two carbon nanotubes to an individual 7 nm gold particle, resulting in a system with multiple tunnel junctions. Single-electron charging effects in the gold particle was found to dominate the electrical transport measurements at T=4.2 K, whereas charging effects in the two carbon nanotube leads appeared as a fine structure. A simulation of the electrical transport in the system has been carried out using SIMON*, which is a Monte Carlo based simulation program for single-electronics. Using this program we have been able to fit a model to the experimental data and to explain the electrical transport characteristics
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author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
electrical transport measurements, single electron charging effects, multiple tunnel junctions, electrical contacts, scanning probe manipulation, transistor modelling, transistor fabrication, single electron transistor, gold nanoparticle, carbon nanotube, fine structure, simulation of nanostructures, Monte Carlo based simulation, 7 nm, 4.2 K, Au-C
in
7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science
pages
2 pages
publisher
Lund University
conference name
Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
language
English
LU publication?
yes
id
4c7a8210-eeab-4912-b649-060debccd4ca (old id 611146)
date added to LUP
2007-11-29 10:02:46
date last changed
2016-04-16 07:33:57
@misc{4c7a8210-eeab-4912-b649-060debccd4ca,
  abstract     = {Scanning probe manipulation has been used to electrically connect two carbon nanotubes to an individual 7 nm gold particle, resulting in a system with multiple tunnel junctions. Single-electron charging effects in the gold particle was found to dominate the electrical transport measurements at T=4.2 K, whereas charging effects in the two carbon nanotube leads appeared as a fine structure. A simulation of the electrical transport in the system has been carried out using SIMON*, which is a Monte Carlo based simulation program for single-electronics. Using this program we have been able to fit a model to the experimental data and to explain the electrical transport characteristics},
  author       = {Thelander, Claes and Magnusson, Martin and Deppert, Knut and Samuelson, Lars and Poulsen, P.R. and Nygard, J. and Borggreen, J.},
  keyword      = {electrical transport measurements,single electron charging effects,multiple tunnel junctions,electrical contacts,scanning probe manipulation,transistor modelling,transistor fabrication,single electron transistor,gold nanoparticle,carbon nanotube,fine structure,simulation of nanostructures,Monte Carlo based simulation,7 nm,4.2 K,Au-C},
  language     = {eng},
  pages        = {2},
  publisher    = {ARRAY(0x82a3530)},
  series       = {7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science},
  title        = {Fabrication and modeling of a combined gold nanoparticle-carbon nanotube single electron transistor},
  year         = {2002},
}