Multifrequency Test and Diagnosis of Analog Circuits Using Constraint Programming and Interval Arithmetic
(2003) IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2003- Abstract
- Analog circuits are often specified using non-linear equations, which are difficult to analyze. Therefore, test generation and diagnosis are problematic issues in practice. In this paper we propose a new method for diagnosis of analog circuits that uses combined information from tests at different frequencies. By solving simultaneously the resulting equations (one for each test frequency), we get a reliable method that decreases the number of possible answers to the diagnosis
problem. The min-max optimization algorithm that we implemented for non-linear transfer functions gives good average runtime for diagnosis parametric
faults.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/622129
- author
- Fuentes, Ana LU and Kuchcinski, Krzysztof LU
- organization
- publishing date
- 2003
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- Proceedings of the IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
- conference name
- IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2003
- conference location
- Poznan, Poland
- conference dates
- 2003-04-14 - 2003-04-16
- language
- English
- LU publication?
- yes
- id
- 1b7e9188-6158-4024-a540-c6ef0f85f938 (old id 622129)
- date added to LUP
- 2016-04-04 12:53:37
- date last changed
- 2021-05-05 11:09:03
@inproceedings{1b7e9188-6158-4024-a540-c6ef0f85f938, abstract = {{Analog circuits are often specified using non-linear equations, which are difficult to analyze. Therefore, test generation and diagnosis are problematic issues in practice. In this paper we propose a new method for diagnosis of analog circuits that uses combined information from tests at different frequencies. By solving simultaneously the resulting equations (one for each test frequency), we get a reliable method that decreases the number of possible answers to the diagnosis<br/><br> problem. The min-max optimization algorithm that we implemented for non-linear transfer functions gives good average runtime for diagnosis parametric<br/><br> faults.}}, author = {{Fuentes, Ana and Kuchcinski, Krzysztof}}, booktitle = {{Proceedings of the IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems}}, language = {{eng}}, title = {{Multifrequency Test and Diagnosis of Analog Circuits Using Constraint Programming and Interval Arithmetic}}, year = {{2003}}, }