Advanced

SCM metrics - a response

Bendix, Lars LU ; Ehnbom, Dag and Steen, Ulf (2007) In CM Journal 2007(May).
Abstract
It was a great pleasure for us to discover that the March issue of the CM Journal was dedicated to SCM metrics. We have been interested in SCM metrics for a long time and have worked with them for the past couple of years. So it was with great interest and curiosity that we read through the five papers in the issue. However, the more we read, the more we realised that there are two - to us - very different interpretations of "SCM metrics".
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
CM Journal
volume
2007
issue
May
language
English
LU publication?
yes
id
8a89c515-3bcf-4329-8663-108e4003f4a8 (old id 630917)
date added to LUP
2007-11-28 09:07:50
date last changed
2016-04-16 11:40:33
@misc{8a89c515-3bcf-4329-8663-108e4003f4a8,
  abstract     = {It was a great pleasure for us to discover that the March issue of the CM Journal was dedicated to SCM metrics. We have been interested in SCM metrics for a long time and have worked with them for the past couple of years. So it was with great interest and curiosity that we read through the five papers in the issue. However, the more we read, the more we realised that there are two - to us - very different interpretations of "SCM metrics".},
  author       = {Bendix, Lars and Ehnbom, Dag and Steen, Ulf},
  language     = {eng},
  number       = {May},
  series       = {CM Journal},
  title        = {SCM metrics - a response},
  volume       = {2007},
  year         = {2007},
}