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A Self-Reconfiguring IEEE 1687 Network for Fault Monitoring

Ghani Zadegan, Farrokh LU ; Nikolov, Dimitar LU and Larsson, Erik LU (2016) European Test Symposium (ETS) In Proceedings of the European Test Symposium (ETS)
Abstract
Efficient handling of faults during operation is highly dependent on the interval (latency) from the time embedded instruments detect errors to the time when the fault manager localizes the errors. In this paper, we propose a self-reconfiguring IEEE 1687 network in which all instruments that have detected errors are automatically included in the scan path. To enable self-reconfiguration, we propose a modified segment insertion bit (SIB) compliant to IEEE 1687. We provide time analyses on error detection and fault localization for single and multiple faults, and we suggest how the self-reconfiguring IEEE 1687 network should be designed such that time for error detection and fault localization is kept low and deterministic. For validation,... (More)
Efficient handling of faults during operation is highly dependent on the interval (latency) from the time embedded instruments detect errors to the time when the fault manager localizes the errors. In this paper, we propose a self-reconfiguring IEEE 1687 network in which all instruments that have detected errors are automatically included in the scan path. To enable self-reconfiguration, we propose a modified segment insertion bit (SIB) compliant to IEEE 1687. We provide time analyses on error detection and fault localization for single and multiple faults, and we suggest how the self-reconfiguring IEEE 1687 network should be designed such that time for error detection and fault localization is kept low and deterministic. For validation, we implemented and performed post-layout simulations for one self-reconfiguring network. We show that compared to previous schemes, our proposed network significantly reduces the fault localization time. (Less)
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author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
in press
subject
keywords
IEEE 1687, fault monitoring, self-reconfiguration, time analysis
in
Proceedings of the European Test Symposium (ETS)
pages
6 pages
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
European Test Symposium (ETS)
language
English
LU publication?
yes
id
67230b79-9192-45c4-9f82-f5915b6c19da
date added to LUP
2016-06-01 11:48:16
date last changed
2016-06-01 11:57:13
@misc{67230b79-9192-45c4-9f82-f5915b6c19da,
  abstract     = {Efficient handling of faults during operation is highly dependent on the interval (latency) from the time embedded instruments detect errors to the time when the fault manager localizes the errors. In this paper, we propose a  self-reconfiguring IEEE 1687 network in which all instruments that have detected errors are automatically included in the scan path. To enable self-reconfiguration, we propose a modified segment insertion bit (SIB) compliant to IEEE 1687. We provide time analyses on error detection and fault localization for single and multiple faults, and we suggest how the self-reconfiguring IEEE 1687 network should be designed such that time for error detection and fault localization is kept low and deterministic. For validation, we implemented and performed post-layout simulations for one self-reconfiguring network. We show that compared to previous schemes, our proposed network significantly reduces the fault localization time.},
  author       = {Ghani Zadegan, Farrokh and Nikolov, Dimitar and Larsson, Erik},
  keyword      = {IEEE 1687,fault monitoring,self-reconfiguration,time analysis},
  language     = {eng},
  pages        = {6},
  publisher    = {ARRAY(0xd402f08)},
  series       = {Proceedings of the European Test Symposium (ETS)},
  title        = {A Self-Reconfiguring IEEE 1687 Network for Fault Monitoring},
  year         = {2016},
}