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Thermal effects of undulator radiation on Si optics for a plane grating monochromator

Jensen, B. N. LU ; Mancini, D. C. and Nyholm, R. LU (1995) In Review of Scientific Instruments 66(2). p.2129-2131
Abstract

Insertion devices on the third-generation 1.5 GeV electron storage ring MAX II will subject the grazing incidence mirrors and gratings of new soft x-ray beamlines to high thermal loads. These thermal loads will cause distortion in the optical surfaces which can be reduced to acceptable levels by the proper choice of substrate material and cooling. A finite element analysis of the temperature variation and thermal distortions is carried out for Si plane mirrors and gratings under thermal load from the 66 mm period undulator planned for MAX II. The energy dependence of the reflectivity for Au-coated mirrors is taken into account. The minimum cooling requirements are determined for each of these optical components in the beamline. The... (More)

Insertion devices on the third-generation 1.5 GeV electron storage ring MAX II will subject the grazing incidence mirrors and gratings of new soft x-ray beamlines to high thermal loads. These thermal loads will cause distortion in the optical surfaces which can be reduced to acceptable levels by the proper choice of substrate material and cooling. A finite element analysis of the temperature variation and thermal distortions is carried out for Si plane mirrors and gratings under thermal load from the 66 mm period undulator planned for MAX II. The energy dependence of the reflectivity for Au-coated mirrors is taken into account. The minimum cooling requirements are determined for each of these optical components in the beamline. The effect of the final induced figure errors on the performance of a plane grating monochromator are discussed. © 1995 American Institute of Physics.

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organization
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type
Contribution to journal
publication status
published
subject
in
Review of Scientific Instruments
volume
66
issue
2
pages
3 pages
publisher
American Institute of Physics
external identifiers
  • Scopus:0029244303
ISSN
0034-6748
DOI
10.1063/1.1145749
language
English
LU publication?
yes
id
82735688-cc16-4396-a510-fd7fb3f79ebe
date added to LUP
2016-04-29 11:01:05
date last changed
2016-05-02 09:03:47
@misc{82735688-cc16-4396-a510-fd7fb3f79ebe,
  abstract     = {<p>Insertion devices on the third-generation 1.5 GeV electron storage ring MAX II will subject the grazing incidence mirrors and gratings of new soft x-ray beamlines to high thermal loads. These thermal loads will cause distortion in the optical surfaces which can be reduced to acceptable levels by the proper choice of substrate material and cooling. A finite element analysis of the temperature variation and thermal distortions is carried out for Si plane mirrors and gratings under thermal load from the 66 mm period undulator planned for MAX II. The energy dependence of the reflectivity for Au-coated mirrors is taken into account. The minimum cooling requirements are determined for each of these optical components in the beamline. The effect of the final induced figure errors on the performance of a plane grating monochromator are discussed. © 1995 American Institute of Physics.</p>},
  author       = {Jensen, B. N. and Mancini, D. C. and Nyholm, R.},
  issn         = {0034-6748},
  language     = {eng},
  number       = {2},
  pages        = {2129--2131},
  publisher    = {ARRAY(0x880dce0)},
  series       = {Review of Scientific Instruments},
  title        = {Thermal effects of undulator radiation on Si optics for a plane grating monochromator},
  url          = {http://dx.doi.org/10.1063/1.1145749},
  volume       = {66},
  year         = {1995},
}