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On the Testability of IEEE 1687 Networks

Cantoro, Riccardo; Montazeri, Mehrdad; Sonza Reorda, Matteo; Ghani Zadegan, Farrokh LU and Larsson, Erik LU (2015) Asian Test Symposium (ATS15) In 2015 IEEE 24th Asian Test Symposium (ATS) p.211-216
Abstract
Due to the increasing usage of embedded instruments in many electronic devices, new solutions to effectively access these instruments appeared, including the new IEEE 1687 standard. The approach supported by IEEE 1687 allows a flexible access to embedded instruments through the Boundary Scan interface. The IEEE 1687 network includes a set of reconfigurable scan chains. This paper addresses the issue of testing the circuitry implementing them, checking whether any permanent hardware fault exists, affecting either the registers associated to the instruments made accessible by the network, or the configuration structures it embeds (e.g., the multiplexers and the associated flip flops). The paper proposes an approach, in which the IEEE 1687... (More)
Due to the increasing usage of embedded instruments in many electronic devices, new solutions to effectively access these instruments appeared, including the new IEEE 1687 standard. The approach supported by IEEE 1687 allows a flexible access to embedded instruments through the Boundary Scan interface. The IEEE 1687 network includes a set of reconfigurable scan chains. This paper addresses the issue of testing the circuitry implementing them, checking whether any permanent hardware fault exists, affecting either the registers associated to the instruments made accessible by the network, or the configuration structures it embeds (e.g., the multiplexers and the associated flip flops). The paper proposes an approach, in which the IEEE 1687 network undergoes a sequence of test sessions, each composed of a configuration phase and a test phase. By properly selecting the network configurations to be used, we can guarantee that the method can test any permanent fault possibly affecting the network. We also provide some experimental results gathered on a set of benchmark networks, allowing to practically evaluate the viability of the approach. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
in
2015 IEEE 24th Asian Test Symposium (ATS)
pages
6 pages
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
Asian Test Symposium (ATS15)
external identifiers
  • Scopus:84963517145
DOI
10.1109/ATS.2015.7447934
language
English
LU publication?
yes
id
d41b4f5a-f89f-4faf-8610-f26cce58235f (old id 8301410)
date added to LUP
2015-12-08 09:36:46
date last changed
2016-10-13 04:47:05
@misc{d41b4f5a-f89f-4faf-8610-f26cce58235f,
  abstract     = {Due to the increasing usage of embedded instruments in many electronic devices, new solutions to effectively access these instruments appeared, including the new IEEE 1687 standard. The approach supported by IEEE 1687 allows a flexible access to embedded instruments through the Boundary Scan interface. The IEEE 1687 network includes a set of reconfigurable scan chains. This paper addresses the issue of testing the circuitry implementing them, checking whether any permanent hardware fault exists, affecting either the registers associated to the instruments made accessible by the network, or the configuration structures it embeds (e.g., the multiplexers and the associated flip flops). The paper proposes an approach, in which the IEEE 1687 network undergoes a sequence of test sessions, each composed of a configuration phase and a test phase. By properly selecting the network configurations to be used, we can guarantee that the method can test any permanent fault possibly affecting the network. We also provide some experimental results gathered on a set of benchmark networks, allowing to practically evaluate the viability of the approach.},
  author       = {Cantoro, Riccardo and Montazeri, Mehrdad and Sonza Reorda, Matteo and Ghani Zadegan, Farrokh and Larsson, Erik},
  language     = {eng},
  pages        = {211--216},
  publisher    = {ARRAY(0xa36f468)},
  series       = {2015 IEEE 24th Asian Test Symposium (ATS)},
  title        = {On the Testability of IEEE 1687 Networks},
  url          = {http://dx.doi.org/10.1109/ATS.2015.7447934},
  year         = {2015},
}