Advanced

Signal-to-noise criterion for free-propagation imaging techniques at free-electron lasers and synchrotrons

Villanueva-Perez, Pablo; Pedrini, Bill; Mokso, Rajmund LU ; Guizar-Sicairos, Manuel; Arcadu, Filippo and Stampanoni, Marco (2016) In Optics Express 24(4). p.3189-3201
Abstract

We propose a signal-to-noise criterion which predicts whether a feature of a given size and scattering strength, placed inside a larger object, can be retrieved with two common X-ray imaging techniques: coherent diffraction imaging and projection microscopy. This criterion, based on how efficiently these techniques detect the scattered photons and validated through simulations, shows in general that projection microscopy can resolve smaller phase differences and features than coherent diffraction imaging. Our criterion can be used to design optimized imaging experiments and perform feasibility studies for sensitive biological materials in free-electron lasers, where the number of photons per pulse is limited, or in synchrotron... (More)

We propose a signal-to-noise criterion which predicts whether a feature of a given size and scattering strength, placed inside a larger object, can be retrieved with two common X-ray imaging techniques: coherent diffraction imaging and projection microscopy. This criterion, based on how efficiently these techniques detect the scattered photons and validated through simulations, shows in general that projection microscopy can resolve smaller phase differences and features than coherent diffraction imaging. Our criterion can be used to design optimized imaging experiments and perform feasibility studies for sensitive biological materials in free-electron lasers, where the number of photons per pulse is limited, or in synchrotron experiments, for both techniques.

(Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Optics Express
volume
24
issue
4
pages
13 pages
publisher
OSA
external identifiers
  • Scopus:84961728304
ISSN
1094-4087
DOI
10.1364/OE.24.003189
language
English
LU publication?
yes
id
f47f1414-3384-453d-b8ea-12d92352d407
date added to LUP
2016-07-14 13:22:55
date last changed
2016-12-04 04:52:54
@misc{f47f1414-3384-453d-b8ea-12d92352d407,
  abstract     = {<p>We propose a signal-to-noise criterion which predicts whether a feature of a given size and scattering strength, placed inside a larger object, can be retrieved with two common X-ray imaging techniques: coherent diffraction imaging and projection microscopy. This criterion, based on how efficiently these techniques detect the scattered photons and validated through simulations, shows in general that projection microscopy can resolve smaller phase differences and features than coherent diffraction imaging. Our criterion can be used to design optimized imaging experiments and perform feasibility studies for sensitive biological materials in free-electron lasers, where the number of photons per pulse is limited, or in synchrotron experiments, for both techniques.</p>},
  author       = {Villanueva-Perez, Pablo and Pedrini, Bill and Mokso, Rajmund and Guizar-Sicairos, Manuel and Arcadu, Filippo and Stampanoni, Marco},
  issn         = {1094-4087},
  language     = {eng},
  month        = {02},
  number       = {4},
  pages        = {3189--3201},
  publisher    = {ARRAY(0x95f8848)},
  series       = {Optics Express},
  title        = {Signal-to-noise criterion for free-propagation imaging techniques at free-electron lasers and synchrotrons},
  url          = {http://dx.doi.org/10.1364/OE.24.003189},
  volume       = {24},
  year         = {2016},
}