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Accurate and experimentally validated transition data for Si I and Si II

Pehlivan Rhodin, A. LU ; Hartman, H. LU orcid ; Nilsson, H. LU and Jönsson, P. (2024) In Astronomy and Astrophysics 682.
Abstract

Aims. The aim of this study is to provide radiative data for neutral and singly ionised silicon, in particular for the first experimental oscillator strengths for near-infrared Si I lines. In addition, we aim to perform atomic structure calculations both for neutral and singly ionised silicon while including lines from highly excited levels. Methods. We performed large-scale atomic structure calculations with the relativistic multiconfiguration Dirac-Hartree-Fock method using the GRASP2K package to determine log(ð A) values of Si I and Si II lines, taking into account valence-valence and core-valence electron correlation. In addition, we derived oscillator strengths of near-infrared Si I lines by combining the experimental branching... (More)

Aims. The aim of this study is to provide radiative data for neutral and singly ionised silicon, in particular for the first experimental oscillator strengths for near-infrared Si I lines. In addition, we aim to perform atomic structure calculations both for neutral and singly ionised silicon while including lines from highly excited levels. Methods. We performed large-scale atomic structure calculations with the relativistic multiconfiguration Dirac-Hartree-Fock method using the GRASP2K package to determine log(ð A) values of Si I and Si II lines, taking into account valence-valence and core-valence electron correlation. In addition, we derived oscillator strengths of near-infrared Si I lines by combining the experimental branching fractions with radiative lifetimes from our calculations. The silicon plasma was obtained from a hollow cathode discharge lamp, and the intensity-calibrated high-resolution spectra between 1037 and 2655 nm were recorded by a Fourier transform spectrometer. Results. We provide an extensive set of accurate experimental and theoretical log(ðA) values. For the first time, we derived 17 log(ðA) values of Si I lines in the infrared from experimental measurements. We report data for 1500 Si I lines and 500 Si II lines. The experimental uncertainties of our A-values vary between 5% for the strong lines and 25% for the weak lines. The theoretical log(ð A) values for Si I lines in the range 161 nm to 6340 nm agree very well with the experimental values of this study and complete the missing transitions involving levels up to 3s23p7s (61 970 cm' 1). In addition, we provide accurate calculated log(ðA) values of Si II lines from the levels up to 3s27f (122 483 cm' 1) in the range 81 nm to 7324 nm.

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author
; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Atomic data, Methods: laboratory: atomic, Methods: numerical, Techniques: spectroscopic
in
Astronomy and Astrophysics
volume
682
article number
A184
publisher
EDP Sciences
external identifiers
  • scopus:85186144682
ISSN
0004-6361
DOI
10.1051/0004-6361/202245686
language
English
LU publication?
yes
id
00fb29ce-c840-44e5-9620-59e7ce661549
date added to LUP
2024-03-27 15:32:02
date last changed
2024-03-28 06:52:44
@article{00fb29ce-c840-44e5-9620-59e7ce661549,
  abstract     = {{<p>Aims. The aim of this study is to provide radiative data for neutral and singly ionised silicon, in particular for the first experimental oscillator strengths for near-infrared Si I lines. In addition, we aim to perform atomic structure calculations both for neutral and singly ionised silicon while including lines from highly excited levels. Methods. We performed large-scale atomic structure calculations with the relativistic multiconfiguration Dirac-Hartree-Fock method using the GRASP2K package to determine log(ð A) values of Si I and Si II lines, taking into account valence-valence and core-valence electron correlation. In addition, we derived oscillator strengths of near-infrared Si I lines by combining the experimental branching fractions with radiative lifetimes from our calculations. The silicon plasma was obtained from a hollow cathode discharge lamp, and the intensity-calibrated high-resolution spectra between 1037 and 2655 nm were recorded by a Fourier transform spectrometer. Results. We provide an extensive set of accurate experimental and theoretical log(ðA) values. For the first time, we derived 17 log(ðA) values of Si I lines in the infrared from experimental measurements. We report data for 1500 Si I lines and 500 Si II lines. The experimental uncertainties of our A-values vary between 5% for the strong lines and 25% for the weak lines. The theoretical log(ð A) values for Si I lines in the range 161 nm to 6340 nm agree very well with the experimental values of this study and complete the missing transitions involving levels up to 3s<sup>2</sup>3p7s (61 970 cm<sup>' 1</sup>). In addition, we provide accurate calculated log(ðA) values of Si II lines from the levels up to 3s<sup>2</sup>7f (122 483 cm<sup>' 1</sup>) in the range 81 nm to 7324 nm.</p>}},
  author       = {{Pehlivan Rhodin, A. and Hartman, H. and Nilsson, H. and Jönsson, P.}},
  issn         = {{0004-6361}},
  keywords     = {{Atomic data; Methods: laboratory: atomic; Methods: numerical; Techniques: spectroscopic}},
  language     = {{eng}},
  publisher    = {{EDP Sciences}},
  series       = {{Astronomy and Astrophysics}},
  title        = {{Accurate and experimentally validated transition data for Si I and Si II}},
  url          = {{http://dx.doi.org/10.1051/0004-6361/202245686}},
  doi          = {{10.1051/0004-6361/202245686}},
  volume       = {{682}},
  year         = {{2024}},
}