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On the diagnostic analysis of IEEE 1687 networks

Cantoro, R. ; Montazeri, M. ; Reorda, M. Sonza ; Zadegan, F. Ghani LU and Larsson, E. LU orcid (2016) 21st IEEE European Test Symposium, ETS 2016
Abstract

The IEEE 1687 standard describes reconfigurable structures allowing to flexibly access the instruments existing within devices (e.g., to support test, diagnosis, calibration, etc.), by using configuration modules which act as controllable switches. The increasing adoption of this standard requires the availability of algorithms and tools to automate its usage. The resulting networks might be affected by defects preventing their correct operation. This necessitates the availability of solutions which allow not only to test against defects, but also to identify the location of possible faults via diagnosis. This paper for the first time addresses the problem of the diagnosis of IEEE 1687 networks. Experimental results gathered on a set of... (More)

The IEEE 1687 standard describes reconfigurable structures allowing to flexibly access the instruments existing within devices (e.g., to support test, diagnosis, calibration, etc.), by using configuration modules which act as controllable switches. The increasing adoption of this standard requires the availability of algorithms and tools to automate its usage. The resulting networks might be affected by defects preventing their correct operation. This necessitates the availability of solutions which allow not only to test against defects, but also to identify the location of possible faults via diagnosis. This paper for the first time addresses the problem of the diagnosis of IEEE 1687 networks. Experimental results gathered on a set of benchmark networks show the feasibility of the solution and provide a first idea about the length of the required input stimuli.

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Please use this url to cite or link to this publication:
author
; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Proceedings - 2016 21st IEEE European Test Symposium, ETS 2016
article number
7519294
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
21st IEEE European Test Symposium, ETS 2016
conference location
Amsterdam, Netherlands
conference dates
2016-05-23 - 2016-05-26
external identifiers
  • scopus:84991453494
ISBN
9781467396592
DOI
10.1109/ETS.2016.7519294
language
English
LU publication?
yes
id
01a0dfe9-02f2-4cf7-ac00-860fab6e7f3a
date added to LUP
2017-01-12 10:22:45
date last changed
2022-01-30 17:00:31
@inproceedings{01a0dfe9-02f2-4cf7-ac00-860fab6e7f3a,
  abstract     = {{<p>The IEEE 1687 standard describes reconfigurable structures allowing to flexibly access the instruments existing within devices (e.g., to support test, diagnosis, calibration, etc.), by using configuration modules which act as controllable switches. The increasing adoption of this standard requires the availability of algorithms and tools to automate its usage. The resulting networks might be affected by defects preventing their correct operation. This necessitates the availability of solutions which allow not only to test against defects, but also to identify the location of possible faults via diagnosis. This paper for the first time addresses the problem of the diagnosis of IEEE 1687 networks. Experimental results gathered on a set of benchmark networks show the feasibility of the solution and provide a first idea about the length of the required input stimuli.</p>}},
  author       = {{Cantoro, R. and Montazeri, M. and Reorda, M. Sonza and Zadegan, F. Ghani and Larsson, E.}},
  booktitle    = {{Proceedings - 2016 21st IEEE European Test Symposium, ETS 2016}},
  isbn         = {{9781467396592}},
  language     = {{eng}},
  month        = {{07}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  title        = {{On the diagnostic analysis of IEEE 1687 networks}},
  url          = {{http://dx.doi.org/10.1109/ETS.2016.7519294}},
  doi          = {{10.1109/ETS.2016.7519294}},
  year         = {{2016}},
}