Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge
(2015) In Journal of Synchrotron Radiation 22. p.961-967- Abstract
- An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/7790851
- author
- Ketenoglu, Didem ; Harder, Manuel ; Klementiev, Konstantin LU ; Upton, Mary ; Taherkhani, Mehran ; Spiwek, Manfred ; Dill, Frank-Uwe ; Wille, Hans-Christian and Yavas, Hasan
- organization
- publishing date
- 2015
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- resonant inelastic X-ray scattering (RIXS), high energy-resolution, diced crystal analyzers, quartz
- in
- Journal of Synchrotron Radiation
- volume
- 22
- pages
- 961 - 967
- publisher
- International Union of Crystallography
- external identifiers
-
- pmid:26134800
- wos:000357407900012
- scopus:84937433772
- pmid:26134800
- ISSN
- 1600-5775
- DOI
- 10.1107/S1600577515009686
- language
- English
- LU publication?
- yes
- id
- 042edf2d-4cbf-4cc9-b778-a75a13a6cf32 (old id 7790851)
- date added to LUP
- 2016-04-01 13:10:21
- date last changed
- 2022-03-29 05:56:29
@article{042edf2d-4cbf-4cc9-b778-a75a13a6cf32, abstract = {{An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.}}, author = {{Ketenoglu, Didem and Harder, Manuel and Klementiev, Konstantin and Upton, Mary and Taherkhani, Mehran and Spiwek, Manfred and Dill, Frank-Uwe and Wille, Hans-Christian and Yavas, Hasan}}, issn = {{1600-5775}}, keywords = {{resonant inelastic X-ray scattering (RIXS); high energy-resolution; diced crystal analyzers; quartz}}, language = {{eng}}, pages = {{961--967}}, publisher = {{International Union of Crystallography}}, series = {{Journal of Synchrotron Radiation}}, title = {{Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge}}, url = {{http://dx.doi.org/10.1107/S1600577515009686}}, doi = {{10.1107/S1600577515009686}}, volume = {{22}}, year = {{2015}}, }