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In situ Brewster angle microscopy and surface pressure studies on the interfacial growth of mesostructured silica thin films

Edler, Karen J. LU orcid ; Roser, Steve J. and Mann, Stephen (2000) In Chemical Communications p.773-774
Abstract

Growth of a mesostructured silica thin film at the air/water interface was observed in situ using Brewster angle microscopy and surface pressure measurements allowing real time observation of nucleation of the film and its rapid growth to full surface coverage at the end of the induction period.

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author
; and
publishing date
type
Contribution to journal
publication status
published
in
Chemical Communications
issue
9
pages
2 pages
publisher
Royal Society of Chemistry
external identifiers
  • scopus:0034616530
ISSN
1359-7345
DOI
10.1039/b000375l
language
English
LU publication?
no
id
06aa5f07-093d-4096-9520-eefc5a6801f1
date added to LUP
2023-05-04 18:09:14
date last changed
2023-06-13 12:18:22
@article{06aa5f07-093d-4096-9520-eefc5a6801f1,
  abstract     = {{<p>Growth of a mesostructured silica thin film at the air/water interface was observed in situ using Brewster angle microscopy and surface pressure measurements allowing real time observation of nucleation of the film and its rapid growth to full surface coverage at the end of the induction period.</p>}},
  author       = {{Edler, Karen J. and Roser, Steve J. and Mann, Stephen}},
  issn         = {{1359-7345}},
  language     = {{eng}},
  month        = {{05}},
  number       = {{9}},
  pages        = {{773--774}},
  publisher    = {{Royal Society of Chemistry}},
  series       = {{Chemical Communications}},
  title        = {{<i>In situ</i> Brewster angle microscopy and surface pressure studies on the interfacial growth of mesostructured silica thin films}},
  url          = {{http://dx.doi.org/10.1039/b000375l}},
  doi          = {{10.1039/b000375l}},
  year         = {{2000}},
}