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Nonlinear electrical properties of Si three-terminal junction devices

Meng, Fantao ; Sun, Jie LU ; Graczyk, Mariusz LU ; Zhang, Kailiang ; Prunnila, Mika ; Ahopelto, Jouni ; Shi, Peixiong ; Chu, Jinkui ; Maximov, Ivan LU orcid and Xu, Hongqi LU (2010) In Applied Physics Letters 97(24).
Abstract
This letter reports on the realization and characterization of silicon three-terminal junction devices made in a silicon-on-insulator wafer. Room temperature electrical measurements show that the fabricated devices exhibit pronounced nonlinear electrical properties inherent to ballistic electron transport in a three-terminal ballistic junction (TBJ) device. The results show that room temperature functional TBJ devices can be realized in a semiconductor material other than high-mobility III-V semiconductor heterostructures and provide a simple design principle for compact silicon devices in nanoelectronics. (C) 2010 American Institute of Physics. [doi:10.1063/1.3526725]
Please use this url to cite or link to this publication:
author
; ; ; ; ; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
in
Applied Physics Letters
volume
97
issue
24
article number
242106
publisher
American Institute of Physics (AIP)
external identifiers
  • wos:000285481000031
  • scopus:78650376760
ISSN
0003-6951
DOI
10.1063/1.3526725
language
English
LU publication?
yes
id
0ab4acf6-d38f-49f9-bda3-121030efbb9a (old id 1831254)
date added to LUP
2016-04-01 09:50:07
date last changed
2025-04-03 17:08:08
@article{0ab4acf6-d38f-49f9-bda3-121030efbb9a,
  abstract     = {{This letter reports on the realization and characterization of silicon three-terminal junction devices made in a silicon-on-insulator wafer. Room temperature electrical measurements show that the fabricated devices exhibit pronounced nonlinear electrical properties inherent to ballistic electron transport in a three-terminal ballistic junction (TBJ) device. The results show that room temperature functional TBJ devices can be realized in a semiconductor material other than high-mobility III-V semiconductor heterostructures and provide a simple design principle for compact silicon devices in nanoelectronics. (C) 2010 American Institute of Physics. [doi:10.1063/1.3526725]}},
  author       = {{Meng, Fantao and Sun, Jie and Graczyk, Mariusz and Zhang, Kailiang and Prunnila, Mika and Ahopelto, Jouni and Shi, Peixiong and Chu, Jinkui and Maximov, Ivan and Xu, Hongqi}},
  issn         = {{0003-6951}},
  language     = {{eng}},
  number       = {{24}},
  publisher    = {{American Institute of Physics (AIP)}},
  series       = {{Applied Physics Letters}},
  title        = {{Nonlinear electrical properties of Si three-terminal junction devices}},
  url          = {{http://dx.doi.org/10.1063/1.3526725}},
  doi          = {{10.1063/1.3526725}},
  volume       = {{97}},
  year         = {{2010}},
}