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System level mutation analysis applied to a state-based language

Olsson, T. LU and Runeson, P. LU orcid (2001) 8th Annual IEEE International Conference on the Workshop on the Engineering of Computer Based Systems p.222-228
Abstract

One of the great challenges within software testing is to know ira test suite covers a program sufficiently. Mutation analysis is presented as an approach to address that challenge. Faulty versions, or mutants, are created and it is investigated if the test suite is able to discover the defects. The technique is mostly applied to the unit level testing of software programs. In this paper, mutation analysis is applied to integration and system level testing in addition to unit level testing. A state based specification and description language, SDL, is used. The specific structural information is used to employ mutation analysis at different abstraction levels.

Please use this url to cite or link to this publication:
author
and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Proceedings. Eighth Annual IEEE International Conference and Workshop On the Engineering of Computer-Based Systems-ECBS 2001
pages
7 pages
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
8th Annual IEEE International Conference on the Workshop on the Engineering of Computer Based Systems
conference location
Washington, DC, United States
conference dates
2001-04-17 - 2001-04-20
external identifiers
  • scopus:0034966102
ISBN
0-7695-1086-8
DOI
10.1109/ECBS.2001.922426
language
English
LU publication?
yes
id
0da513ad-3e6e-4dcc-9042-59e9bc8f22e5
date added to LUP
2022-10-19 11:41:52
date last changed
2022-10-21 11:55:05
@inproceedings{0da513ad-3e6e-4dcc-9042-59e9bc8f22e5,
  abstract     = {{<p>One of the great challenges within software testing is to know ira test suite covers a program sufficiently. Mutation analysis is presented as an approach to address that challenge. Faulty versions, or mutants, are created and it is investigated if the test suite is able to discover the defects. The technique is mostly applied to the unit level testing of software programs. In this paper, mutation analysis is applied to integration and system level testing in addition to unit level testing. A state based specification and description language, SDL, is used. The specific structural information is used to employ mutation analysis at different abstraction levels.</p>}},
  author       = {{Olsson, T. and Runeson, P.}},
  booktitle    = {{Proceedings. Eighth Annual IEEE International Conference and Workshop On the Engineering of Computer-Based Systems-ECBS 2001}},
  isbn         = {{0-7695-1086-8}},
  language     = {{eng}},
  pages        = {{222--228}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  title        = {{System level mutation analysis applied to a state-based language}},
  url          = {{http://dx.doi.org/10.1109/ECBS.2001.922426}},
  doi          = {{10.1109/ECBS.2001.922426}},
  year         = {{2001}},
}