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A Methodology for Measurements of Basic Parameters in a xDSL System

Brito Jr., Edson; Souza, Lamartine; Patrício, Éder; Castro, Agostinho; Cavalcante, Gervásio; Costa,, JWC; Ericson, Klas; Lindqvist, Fredrik LU and Rius i Riu, Jaume LU (2006) SPIE Broadband Access Communication Technologies, 2006 In Proceedings of SPIE, the International Society for Optical Engineering 6390.
Abstract
In order to qualify a subscriber loops for xDSL transmission, basic parameters like transfer function, scattering parameter S11 and characteristic impedance should be known. The aim of this paper is to present a test methodology for measurements of these basic parameters. The characteristic impedance is measured by open/short method and it is compared with the terminated measurement method defined in IEC (International Electrotechnical Commission) 611156-1. Transfer function and scattering parameter S11 of DSL loop are also measured on a real cable. The methodology is based on measurements of a 0.4 mm, 10 pairs, balanced twisted-pair cable of 1400 m of length. In order to improve the analysis of results, we compared the measurements from... (More)
In order to qualify a subscriber loops for xDSL transmission, basic parameters like transfer function, scattering parameter S11 and characteristic impedance should be known. The aim of this paper is to present a test methodology for measurements of these basic parameters. The characteristic impedance is measured by open/short method and it is compared with the terminated measurement method defined in IEC (International Electrotechnical Commission) 611156-1. Transfer function and scattering parameter S11 of DSL loop are also measured on a real cable. The methodology is based on measurements of a 0.4 mm, 10 pairs, balanced twisted-pair cable of 1400 m of length. In order to improve the analysis of results, we compared the measurements from real cable with results from wireline simulators. The measurement of parameters of xDSL copper loop is done in an infrastructure set up in the LABIT (Technological Innovation in Telecommunications Lab) at UFPA (Federal University of Para), that consist of a wireline simulators, a precision impedance analyzer, and a network analyzer. The results show a difference between the measurements performed with real cables and wireline simulators for transfer function parameter. Characteristic impedance obtained by both methods presented quite similar results. (Less)
Please use this url to cite or link to this publication:
author
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
in
Proceedings of SPIE, the International Society for Optical Engineering
volume
6390
pages
9 pages
conference name
SPIE Broadband Access Communication Technologies, 2006
external identifiers
  • Scopus:33751269350
DOI
10.1117/12.686685
language
English
LU publication?
no
id
2ecebd79-db05-447d-964d-296e7ba914d7 (old id 1029314)
date added to LUP
2008-02-11 15:50:49
date last changed
2017-01-01 08:19:59
@inproceedings{2ecebd79-db05-447d-964d-296e7ba914d7,
  abstract     = {In order to qualify a subscriber loops for xDSL transmission, basic parameters like transfer function, scattering parameter S11 and characteristic impedance should be known. The aim of this paper is to present a test methodology for measurements of these basic parameters. The characteristic impedance is measured by open/short method and it is compared with the terminated measurement method defined in IEC (International Electrotechnical Commission) 611156-1. Transfer function and scattering parameter S11 of DSL loop are also measured on a real cable. The methodology is based on measurements of a 0.4 mm, 10 pairs, balanced twisted-pair cable of 1400 m of length. In order to improve the analysis of results, we compared the measurements from real cable with results from wireline simulators. The measurement of parameters of xDSL copper loop is done in an infrastructure set up in the LABIT (Technological Innovation in Telecommunications Lab) at UFPA (Federal University of Para), that consist of a wireline simulators, a precision impedance analyzer, and a network analyzer. The results show a difference between the measurements performed with real cables and wireline simulators for transfer function parameter. Characteristic impedance obtained by both methods presented quite similar results.},
  author       = {Brito Jr., Edson and Souza, Lamartine and Patrício, Éder and Castro, Agostinho and Cavalcante, Gervásio and Costa,, JWC and Ericson, Klas and Lindqvist, Fredrik and Rius i Riu, Jaume},
  booktitle    = {Proceedings of SPIE, the International Society for Optical Engineering},
  language     = {eng},
  pages        = {9},
  title        = {A Methodology for Measurements of Basic Parameters in a xDSL System},
  url          = {http://dx.doi.org/10.1117/12.686685},
  volume       = {6390},
  year         = {2006},
}