Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction
(2008) In Journal of Applied Crystallography 41(Part 2). p.272-280- Abstract
- InAs nanowire samples grown by metal-organic chemical vapor deposition present a significant amount of wurtzite structure, while the zincblende lattice is known to be the stable crystal structure for the bulk material. The question of the wurtzite distribution in the sample is addressed using phase-sensitive coherent X-ray diffraction with a micro-focused beam at a synchrotron source. The simultaneous investigation of the wurtzite 10 (1) over bar0, 10 (2) over bar0, 10 (3) over bar0 reflections performed on a bunch of single wires shows unambiguously that the wurtzite contribution is a result of stacking faults distributed along the wire. Additional simulations lead to adjustments of the wire structural parameters, such as the wurtzite... (More)
- InAs nanowire samples grown by metal-organic chemical vapor deposition present a significant amount of wurtzite structure, while the zincblende lattice is known to be the stable crystal structure for the bulk material. The question of the wurtzite distribution in the sample is addressed using phase-sensitive coherent X-ray diffraction with a micro-focused beam at a synchrotron source. The simultaneous investigation of the wurtzite 10 (1) over bar0, 10 (2) over bar0, 10 (3) over bar0 reflections performed on a bunch of single wires shows unambiguously that the wurtzite contribution is a result of stacking faults distributed along the wire. Additional simulations lead to adjustments of the wire structural parameters, such as the wurtzite content, the strain distribution, the wire diameters and their respective orientations. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/1186024
- author
- Chamard, Virginie ; Stangl, Julian ; Labat, Stephane ; Mandl, Bernhard LU ; Lechner, Rainer T and Metzger, Till H
- organization
- publishing date
- 2008
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- stacking faults, InAs, nanowires, micro-focusing, coherent X-ray diffraction, synchrotron radiation
- in
- Journal of Applied Crystallography
- volume
- 41
- issue
- Part 2
- pages
- 272 - 280
- publisher
- International Union of Crystallography
- external identifiers
-
- wos:000253992700005
- scopus:40849094335
- ISSN
- 1600-5767
- DOI
- 10.1107/S0021889808001167
- language
- English
- LU publication?
- yes
- id
- 2cbc4a6c-89bc-4166-865d-1194d17502d3 (old id 1186024)
- date added to LUP
- 2016-04-01 11:40:36
- date last changed
- 2022-01-26 08:33:49
@article{2cbc4a6c-89bc-4166-865d-1194d17502d3,
abstract = {{InAs nanowire samples grown by metal-organic chemical vapor deposition present a significant amount of wurtzite structure, while the zincblende lattice is known to be the stable crystal structure for the bulk material. The question of the wurtzite distribution in the sample is addressed using phase-sensitive coherent X-ray diffraction with a micro-focused beam at a synchrotron source. The simultaneous investigation of the wurtzite 10 (1) over bar0, 10 (2) over bar0, 10 (3) over bar0 reflections performed on a bunch of single wires shows unambiguously that the wurtzite contribution is a result of stacking faults distributed along the wire. Additional simulations lead to adjustments of the wire structural parameters, such as the wurtzite content, the strain distribution, the wire diameters and their respective orientations.}},
author = {{Chamard, Virginie and Stangl, Julian and Labat, Stephane and Mandl, Bernhard and Lechner, Rainer T and Metzger, Till H}},
issn = {{1600-5767}},
keywords = {{stacking faults; InAs; nanowires; micro-focusing; coherent X-ray diffraction; synchrotron radiation}},
language = {{eng}},
number = {{Part 2}},
pages = {{272--280}},
publisher = {{International Union of Crystallography}},
series = {{Journal of Applied Crystallography}},
title = {{Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction}},
url = {{http://dx.doi.org/10.1107/S0021889808001167}},
doi = {{10.1107/S0021889808001167}},
volume = {{41}},
year = {{2008}},
}