Advanced

The use and characterization of a backilluminated charge-coupled device in investigations of pulsed x-ray and radiation sources.

Fullagar, Wilfred LU ; Uhlig, Jens LU ; Walczak, Monika LU ; Canton, Sophie LU and Sundström, Villy LU (2008) In Review of Scientific Instruments 79(10).
Abstract
Examinations of bremsstrahlung and energetic electron beams from a novel laser plasma source motivate and assist characterization of a backthinned, backilluminated direct detection x-ray charge-coupled device (CCD), a topology that is uncommon in hard x-ray work. Behavior toward pseudomonochromatic ((55)Fe) and multichromatic ((241)Am) sources is briefly reviewed under optimized noise conditions. Results collectively establish the previously unknown functional depth structure. Several modes of usage are illustrated in approximately 4-20 keV x-ray laser plasma source investigations, where the significance of the characterization is briefly discussed. The spectral redistribution associated with this CCD topology is unfavorable, yet... (More)
Examinations of bremsstrahlung and energetic electron beams from a novel laser plasma source motivate and assist characterization of a backthinned, backilluminated direct detection x-ray charge-coupled device (CCD), a topology that is uncommon in hard x-ray work. Behavior toward pseudomonochromatic ((55)Fe) and multichromatic ((241)Am) sources is briefly reviewed under optimized noise conditions. Results collectively establish the previously unknown functional depth structure. Several modes of usage are illustrated in approximately 4-20 keV x-ray laser plasma source investigations, where the significance of the characterization is briefly discussed. The spectral redistribution associated with this CCD topology is unfavorable, yet appropriate analysis ensures that sufficient spectral information remains for quantitative determination of broadband x-ray flux and spectra in essentially single laser shot measurements. The energy dependence of nascent electron cloud radii in silicon is determined using broadband x-rays from the laser plasma source, turning the narrow depletion depth to advantage. Finally, the characterization is used to quantify recent x-ray spectral explorations of the water jet laser plasma source operating under aspirator vacuum. These results will have key value for establishment of laboratory based ultrafast extended x-ray absorption fine structure experiments using microbolometric detectors. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Review of Scientific Instruments
volume
79
issue
10
publisher
American Institute of Physics
external identifiers
  • wos:000260573500013
  • pmid:19044707
  • scopus:55349106903
ISSN
1089-7623
DOI
10.1063/1.3000003
language
English
LU publication?
yes
id
81a82dbc-6952-47f6-8ac6-ce1de13a3784 (old id 1276638)
date added to LUP
2009-01-29 14:43:10
date last changed
2017-08-13 03:52:59
@article{81a82dbc-6952-47f6-8ac6-ce1de13a3784,
  abstract     = {Examinations of bremsstrahlung and energetic electron beams from a novel laser plasma source motivate and assist characterization of a backthinned, backilluminated direct detection x-ray charge-coupled device (CCD), a topology that is uncommon in hard x-ray work. Behavior toward pseudomonochromatic ((55)Fe) and multichromatic ((241)Am) sources is briefly reviewed under optimized noise conditions. Results collectively establish the previously unknown functional depth structure. Several modes of usage are illustrated in approximately 4-20 keV x-ray laser plasma source investigations, where the significance of the characterization is briefly discussed. The spectral redistribution associated with this CCD topology is unfavorable, yet appropriate analysis ensures that sufficient spectral information remains for quantitative determination of broadband x-ray flux and spectra in essentially single laser shot measurements. The energy dependence of nascent electron cloud radii in silicon is determined using broadband x-rays from the laser plasma source, turning the narrow depletion depth to advantage. Finally, the characterization is used to quantify recent x-ray spectral explorations of the water jet laser plasma source operating under aspirator vacuum. These results will have key value for establishment of laboratory based ultrafast extended x-ray absorption fine structure experiments using microbolometric detectors.},
  articleno    = {103302},
  author       = {Fullagar, Wilfred and Uhlig, Jens and Walczak, Monika and Canton, Sophie and Sundström, Villy},
  issn         = {1089-7623},
  language     = {eng},
  number       = {10},
  publisher    = {American Institute of Physics},
  series       = {Review of Scientific Instruments},
  title        = {The use and characterization of a backilluminated charge-coupled device in investigations of pulsed x-ray and radiation sources.},
  url          = {http://dx.doi.org/10.1063/1.3000003},
  volume       = {79},
  year         = {2008},
}