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Image widening not only a question of tip sample convolution

Tegenfeldt, Jonas O. LU orcid and Montelius, Lars LU (1995) In Applied Physics Letters
Abstract

As the tip in the atomic force microscope is scanned over the sample surface an image results which contains information from the sample as well as from the tip. This mainly results in an increase of the apparent size of the sample. If the tip is reasonably sharp the contribution from the tip is small. In some cases the widening still persists in spite of a very sharp tip. In this letter, a model is presented which ascribes this to the lateral forces twisting the cantilever giving an offset between the apparent point of contact and the real point of contact. This results in a shift between forward and reverse scan of the sample position in the imaging window and, if the lateral forces due to the sample and substrate are different, a... (More)

As the tip in the atomic force microscope is scanned over the sample surface an image results which contains information from the sample as well as from the tip. This mainly results in an increase of the apparent size of the sample. If the tip is reasonably sharp the contribution from the tip is small. In some cases the widening still persists in spite of a very sharp tip. In this letter, a model is presented which ascribes this to the lateral forces twisting the cantilever giving an offset between the apparent point of contact and the real point of contact. This results in a shift between forward and reverse scan of the sample position in the imaging window and, if the lateral forces due to the sample and substrate are different, a change in the apparent width of the sample.

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author
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organization
publishing date
type
Contribution to journal
publication status
published
in
Applied Physics Letters
pages
1 pages
publisher
American Institute of Physics (AIP)
external identifiers
  • scopus:36449002362
ISSN
0003-6951
language
English
LU publication?
yes
id
127b2107-2b5d-40d8-8167-e990687cb172
date added to LUP
2018-10-20 10:54:42
date last changed
2021-01-03 05:48:17
@article{127b2107-2b5d-40d8-8167-e990687cb172,
  abstract     = {{<p>As the tip in the atomic force microscope is scanned over the sample surface an image results which contains information from the sample as well as from the tip. This mainly results in an increase of the apparent size of the sample. If the tip is reasonably sharp the contribution from the tip is small. In some cases the widening still persists in spite of a very sharp tip. In this letter, a model is presented which ascribes this to the lateral forces twisting the cantilever giving an offset between the apparent point of contact and the real point of contact. This results in a shift between forward and reverse scan of the sample position in the imaging window and, if the lateral forces due to the sample and substrate are different, a change in the apparent width of the sample.</p>}},
  author       = {{Tegenfeldt, Jonas O. and Montelius, Lars}},
  issn         = {{0003-6951}},
  language     = {{eng}},
  month        = {{12}},
  publisher    = {{American Institute of Physics (AIP)}},
  series       = {{Applied Physics Letters}},
  title        = {{Image widening not only a question of tip sample convolution}},
  year         = {{1995}},
}