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In situ accelerated leaching of cement paste by application of electrical fields monitored by synchrotron X-ray diffraction

Castellote, M; Turrillas, X; Andrade, C; Alonso, C; Rodriguez, M A and Kvick, Åke LU (2004) In Applied Physics A: Materials Science & Processing 79(3). p.661-669
Abstract
An external dc voltage was applied to a cured cement paste to simulate its natural degradation as a function of time. The electrical treatment was monitored in situ by simultaneous acquisition of diffraction patterns every 10 min. The analysis of the diffraction patterns has confirmed that the microstructure of the whole paste changes during the treatment, with precipitation and dissolution of several phases. This work contributes to the understanding of the fundamentals of the microstructure alterations that take place upon application of an electrical field, allowing the establishment of a first approach to the understanding of the mechanism of these changes.
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics A: Materials Science & Processing
volume
79
issue
3
pages
661 - 669
publisher
Springer
external identifiers
  • scopus:3042689316
ISSN
1432-0630
DOI
10.1007/s00339-003-2076-x
language
English
LU publication?
yes
id
d32541cc-80b1-4e1e-a16a-cd7b3d19103e (old id 140891)
date added to LUP
2007-07-12 16:22:01
date last changed
2017-01-01 04:57:00
@article{d32541cc-80b1-4e1e-a16a-cd7b3d19103e,
  abstract     = {An external dc voltage was applied to a cured cement paste to simulate its natural degradation as a function of time. The electrical treatment was monitored in situ by simultaneous acquisition of diffraction patterns every 10 min. The analysis of the diffraction patterns has confirmed that the microstructure of the whole paste changes during the treatment, with precipitation and dissolution of several phases. This work contributes to the understanding of the fundamentals of the microstructure alterations that take place upon application of an electrical field, allowing the establishment of a first approach to the understanding of the mechanism of these changes.},
  author       = {Castellote, M and Turrillas, X and Andrade, C and Alonso, C and Rodriguez, M A and Kvick, Åke},
  issn         = {1432-0630},
  language     = {eng},
  number       = {3},
  pages        = {661--669},
  publisher    = {Springer},
  series       = {Applied Physics A: Materials Science & Processing},
  title        = {In situ accelerated leaching of cement paste by application of electrical fields monitored by synchrotron X-ray diffraction},
  url          = {http://dx.doi.org/10.1007/s00339-003-2076-x},
  volume       = {79},
  year         = {2004},
}