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Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances

Glover, C. J.; Schmitt, T.; Mattesini, M.; Adell, M.; Ilver, L.; Kanski, J.; Kjeldgaard, Lisbeth LU ; Agaker, M.; Mårtensson, Nils LU and Ahuja, R., et al. (2009) In Journal of Electron Spectroscopy and Related Phenomena 173(2-3). p.103-107
Abstract
Resonant inelastic soft X-ray scattering at the 3p resonances in crystalline Ge is presented. Both stationary and dispersive features are observed in a wide energy range above as well as below the ionization limits. These observations are in agreement with theoretical predictions based on a two-step model where the initially excited electron has no influence on the emission step. Excess population of states in the conduction band is found, and discussed in terms of attosecond electron dynamics. (c) 2009 Elsevier B.V. All rights reserved.
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Contribution to journal
publication status
published
subject
keywords
Spectroscopy, Semiconductors, Soft X-ray scattering (RIXS), Ultrafast dynamics, Synchrotron radiation
in
Journal of Electron Spectroscopy and Related Phenomena
volume
173
issue
2-3
pages
103 - 107
publisher
Elsevier
external identifiers
  • wos:000270245700006
  • scopus:67749115953
ISSN
0368-2048
DOI
10.1016/j.elspec.2009.05.017
language
English
LU publication?
yes
id
90a5bd8c-d451-4559-a82c-8631fd5d3c48 (old id 1490022)
date added to LUP
2009-10-20 11:51:30
date last changed
2017-01-01 06:06:56
@article{90a5bd8c-d451-4559-a82c-8631fd5d3c48,
  abstract     = {Resonant inelastic soft X-ray scattering at the 3p resonances in crystalline Ge is presented. Both stationary and dispersive features are observed in a wide energy range above as well as below the ionization limits. These observations are in agreement with theoretical predictions based on a two-step model where the initially excited electron has no influence on the emission step. Excess population of states in the conduction band is found, and discussed in terms of attosecond electron dynamics. (c) 2009 Elsevier B.V. All rights reserved.},
  author       = {Glover, C. J. and Schmitt, T. and Mattesini, M. and Adell, M. and Ilver, L. and Kanski, J. and Kjeldgaard, Lisbeth and Agaker, M. and Mårtensson, Nils and Ahuja, R. and Nordgren, J. and Rubensson, J. -E.},
  issn         = {0368-2048},
  keyword      = {Spectroscopy,Semiconductors,Soft X-ray scattering (RIXS),Ultrafast dynamics,Synchrotron radiation},
  language     = {eng},
  number       = {2-3},
  pages        = {103--107},
  publisher    = {Elsevier},
  series       = {Journal of Electron Spectroscopy and Related Phenomena},
  title        = {Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances},
  url          = {http://dx.doi.org/10.1016/j.elspec.2009.05.017},
  volume       = {173},
  year         = {2009},
}