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Studies of resolidification of non-thermally molten InSb using time-resolved X-ray diffraction

Harbst, Michael LU ; Hansen, Tue LU ; Caleman, C; Fullagar, Wilfred LU ; Jönsson, P; Sondhauss, Peter LU ; Synnergren, Ola LU and Larsson, Jörgen LU (2005) In Applied Physics A: Materials Science & Processing 81(5). p.893-900
Abstract
We have used time-resolved X-ray diffraction to monitor the resolidification process of molten InSb. Melting was induced by an ultra-short laser pulse and the measurement conducted in a high-repetition-rate multishot experiment. The method gives direct information about the nature of the transient regrowth and permanently damaged layers. It does not rely on models based on surface reflectivity or second harmonic generation (SHG). The measured resolidification process has been modeled with a 1-D thermodynamic heat-conduction model. Important parameters like sample temperature, melting depth and amorphous surface layer thickness come directly out of the data, while mosaicity of the sample and free carrier density can be quantified by... (More)
We have used time-resolved X-ray diffraction to monitor the resolidification process of molten InSb. Melting was induced by an ultra-short laser pulse and the measurement conducted in a high-repetition-rate multishot experiment. The method gives direct information about the nature of the transient regrowth and permanently damaged layers. It does not rely on models based on surface reflectivity or second harmonic generation (SHG). The measured resolidification process has been modeled with a 1-D thermodynamic heat-conduction model. Important parameters like sample temperature, melting depth and amorphous surface layer thickness come directly out of the data, while mosaicity of the sample and free carrier density can be quantified by comparing with models. Melt depths up to 80 nm have been observed and regrowth velocities in the range 2-8 m/s have been measured. (Less)
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics A: Materials Science & Processing
volume
81
issue
5
pages
893 - 900
publisher
Springer
external identifiers
  • wos:000230990200002
  • scopus:23944458119
ISSN
1432-0630
DOI
10.1007/s00339-005-3299-9
language
English
LU publication?
yes
id
8d956976-d70d-4dec-8de9-6cdbed2a5c45 (old id 151871)
date added to LUP
2007-07-03 11:52:29
date last changed
2017-04-09 03:29:34
@article{8d956976-d70d-4dec-8de9-6cdbed2a5c45,
  abstract     = {We have used time-resolved X-ray diffraction to monitor the resolidification process of molten InSb. Melting was induced by an ultra-short laser pulse and the measurement conducted in a high-repetition-rate multishot experiment. The method gives direct information about the nature of the transient regrowth and permanently damaged layers. It does not rely on models based on surface reflectivity or second harmonic generation (SHG). The measured resolidification process has been modeled with a 1-D thermodynamic heat-conduction model. Important parameters like sample temperature, melting depth and amorphous surface layer thickness come directly out of the data, while mosaicity of the sample and free carrier density can be quantified by comparing with models. Melt depths up to 80 nm have been observed and regrowth velocities in the range 2-8 m/s have been measured.},
  author       = {Harbst, Michael and Hansen, Tue and Caleman, C and Fullagar, Wilfred and Jönsson, P and Sondhauss, Peter and Synnergren, Ola and Larsson, Jörgen},
  issn         = {1432-0630},
  language     = {eng},
  number       = {5},
  pages        = {893--900},
  publisher    = {Springer},
  series       = {Applied Physics A: Materials Science & Processing},
  title        = {Studies of resolidification of non-thermally molten InSb using time-resolved X-ray diffraction},
  url          = {http://dx.doi.org/10.1007/s00339-005-3299-9},
  volume       = {81},
  year         = {2005},
}