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Photoemission electron microscopy using extreme ultraviolet attosecond pulse trains

Mikkelsen, Anders LU ; Schwenke, Jörg LU ; Fordell, Thomas LU ; Luo, Gang LU ; Klünder, Kathrin LU ; Hilner, Emelie LU ; Anttu, Nicklas LU ; Zakharov, Alexei LU ; Lundgren, Edvin LU and Mauritsson, Johan LU , et al. (2009) In Review of Scientific Instruments 80(12).
Abstract
We report the first experiments carried out on a new imaging setup, which combines the high spatial resolution of a photoemission electron microscope (PEEM) with the temporal resolution of extreme ultraviolet (XUV) attosecond pulse trains. The very short pulses were provided by high-harmonic generation and used to illuminate lithographic structures and Au nanoparticles, which, in turn, were imaged with a PEEM resolving features below 300 nm. We argue that the spatial resolution is limited by the lack of electron energy filtering in this particular demonstration experiment. Problems with extensive space charge effects, which can occur due to the low probe pulse repetition rate and extremely short duration, are solved by reducing peak... (More)
We report the first experiments carried out on a new imaging setup, which combines the high spatial resolution of a photoemission electron microscope (PEEM) with the temporal resolution of extreme ultraviolet (XUV) attosecond pulse trains. The very short pulses were provided by high-harmonic generation and used to illuminate lithographic structures and Au nanoparticles, which, in turn, were imaged with a PEEM resolving features below 300 nm. We argue that the spatial resolution is limited by the lack of electron energy filtering in this particular demonstration experiment. Problems with extensive space charge effects, which can occur due to the low probe pulse repetition rate and extremely short duration, are solved by reducing peak intensity while maintaining a sufficient average intensity to allow imaging. Finally, a powerful femtosecond infrared (IR) beam was combined with the XUV beam in a pump-probe setup where delays could be varied from subfemtoseconds to picoseconds. The IR pump beam could induce multiphoton electron emission in resonant features on the surface. The interaction between the electrons emitted by the pump and probe pulses could be observed. (C) 2009 American Institute of Physics. [doi:10.1063/1.3263759] (Less)
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Review of Scientific Instruments
volume
80
issue
12
publisher
American Institute of Physics
external identifiers
  • wos:000273217300024
  • scopus:73849120652
ISSN
1089-7623
DOI
10.1063/1.3263759
language
English
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yes
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8b7eb05a-a13b-4bbe-b21f-3a2b33744403 (old id 1531291)
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@article{8b7eb05a-a13b-4bbe-b21f-3a2b33744403,
  abstract     = {We report the first experiments carried out on a new imaging setup, which combines the high spatial resolution of a photoemission electron microscope (PEEM) with the temporal resolution of extreme ultraviolet (XUV) attosecond pulse trains. The very short pulses were provided by high-harmonic generation and used to illuminate lithographic structures and Au nanoparticles, which, in turn, were imaged with a PEEM resolving features below 300 nm. We argue that the spatial resolution is limited by the lack of electron energy filtering in this particular demonstration experiment. Problems with extensive space charge effects, which can occur due to the low probe pulse repetition rate and extremely short duration, are solved by reducing peak intensity while maintaining a sufficient average intensity to allow imaging. Finally, a powerful femtosecond infrared (IR) beam was combined with the XUV beam in a pump-probe setup where delays could be varied from subfemtoseconds to picoseconds. The IR pump beam could induce multiphoton electron emission in resonant features on the surface. The interaction between the electrons emitted by the pump and probe pulses could be observed. (C) 2009 American Institute of Physics. [doi:10.1063/1.3263759]},
  articleno    = {123703},
  author       = {Mikkelsen, Anders and Schwenke, Jörg and Fordell, Thomas and Luo, Gang and Klünder, Kathrin and Hilner, Emelie and Anttu, Nicklas and Zakharov, Alexei and Lundgren, Edvin and Mauritsson, Johan and Andersen, Jesper N and Xu, Hongqi and L'Huillier, Anne},
  issn         = {1089-7623},
  language     = {eng},
  number       = {12},
  publisher    = {American Institute of Physics},
  series       = {Review of Scientific Instruments},
  title        = {Photoemission electron microscopy using extreme ultraviolet attosecond pulse trains},
  url          = {http://dx.doi.org/10.1063/1.3263759},
  volume       = {80},
  year         = {2009},
}