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Interfacial dynamics and structure of surfactant layers

Zhmud, B and Tiberg, Fredrik LU (2005) In Advances in Colloid and Interface Science 113(1). p.21-42
Abstract
The present article provides current opinion on studies of the interfacial dynamics, adsorption, and structure of surfactant layers. The physical principles and applications of physicochemical methods such as tensiometry, ellipsometry, photon correlation spectroscopy, and neutron reflectivity techniques, as well as relevant theoretical aspects related to the adsorption and desorption kinetics, interfacial structure development, wetting enhancement, and the effect of adsorbed surfactant films of the interfacial dynamics, are covered in detail. In order to make the text as self-contained as possible, essential mathematical derivations are given demonstrating how raw data, such as ellipsometric angles or neutron reflectivity, are transformed... (More)
The present article provides current opinion on studies of the interfacial dynamics, adsorption, and structure of surfactant layers. The physical principles and applications of physicochemical methods such as tensiometry, ellipsometry, photon correlation spectroscopy, and neutron reflectivity techniques, as well as relevant theoretical aspects related to the adsorption and desorption kinetics, interfacial structure development, wetting enhancement, and the effect of adsorbed surfactant films of the interfacial dynamics, are covered in detail. In order to make the text as self-contained as possible, essential mathematical derivations are given demonstrating how raw data, such as ellipsometric angles or neutron reflectivity, are transformed into sought layer characteristics, such as thickness or density. (c) 2005 Elsevier B.V. All rights reserved. (Less)
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Advances in Colloid and Interface Science
volume
113
issue
1
pages
21 - 42
publisher
Elsevier
external identifiers
  • pmid:15763237
  • wos:000228340000002
  • scopus:14644442352
ISSN
1873-3727
DOI
10.1016/j.cis.2005.01.001
language
English
LU publication?
yes
id
08d61f16-c6ea-4237-935f-b774934b9a90 (old id 157672)
date added to LUP
2007-07-12 14:25:59
date last changed
2017-10-01 04:35:40
@article{08d61f16-c6ea-4237-935f-b774934b9a90,
  abstract     = {The present article provides current opinion on studies of the interfacial dynamics, adsorption, and structure of surfactant layers. The physical principles and applications of physicochemical methods such as tensiometry, ellipsometry, photon correlation spectroscopy, and neutron reflectivity techniques, as well as relevant theoretical aspects related to the adsorption and desorption kinetics, interfacial structure development, wetting enhancement, and the effect of adsorbed surfactant films of the interfacial dynamics, are covered in detail. In order to make the text as self-contained as possible, essential mathematical derivations are given demonstrating how raw data, such as ellipsometric angles or neutron reflectivity, are transformed into sought layer characteristics, such as thickness or density. (c) 2005 Elsevier B.V. All rights reserved.},
  author       = {Zhmud, B and Tiberg, Fredrik},
  issn         = {1873-3727},
  language     = {eng},
  number       = {1},
  pages        = {21--42},
  publisher    = {Elsevier},
  series       = {Advances in Colloid and Interface Science},
  title        = {Interfacial dynamics and structure of surfactant layers},
  url          = {http://dx.doi.org/10.1016/j.cis.2005.01.001},
  volume       = {113},
  year         = {2005},
}