Shot-to-shot flat-field correction at X-ray free-electron lasers
(2022) In Optics Express 30(7). p.10633-10644- Abstract
X-ray free-electron lasers (XFELs) provide high-brilliance pulses, which offer unique opportunities for coherent X-ray imaging techniques, such as in-line holography. One of the fundamental steps to process in-line holographic data is flat-field correction, which mitigates imaging artifacts and, in turn, enables phase reconstructions. However, conventional flat-field correction approaches cannot correct single XFEL pulses due to the stochastic nature of the self-amplified spontaneous emission (SASE), the mechanism responsible for the high brilliance of XFELs. Here, we demonstrate on simulated and megahertz imaging data, measured at the European XFEL, the possibility of overcoming such a limitation by using two different methods based on... (More)
X-ray free-electron lasers (XFELs) provide high-brilliance pulses, which offer unique opportunities for coherent X-ray imaging techniques, such as in-line holography. One of the fundamental steps to process in-line holographic data is flat-field correction, which mitigates imaging artifacts and, in turn, enables phase reconstructions. However, conventional flat-field correction approaches cannot correct single XFEL pulses due to the stochastic nature of the self-amplified spontaneous emission (SASE), the mechanism responsible for the high brilliance of XFELs. Here, we demonstrate on simulated and megahertz imaging data, measured at the European XFEL, the possibility of overcoming such a limitation by using two different methods based on principal component analysis and deep learning. These methods retrieve flat-field corrected images from individual frames by separating the sample and flat-field signal contributions; thus, enabling advanced phase-retrieval reconstructions. We anticipate that the proposed methods can be implemented in a real-time processing pipeline, which will enable online data analysis and phase reconstructions of coherent full-field imaging techniques such as in-line holography at XFELs.
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- author
- Buakor, Khachiwan ; Zhang, Yuhe LU ; Birnšteinova, Šarlota ; Bellucci, Valerio ; Sato, Takushi ; Kirkwood, Henry ; Mancuso, Adrian P. ; Vagovic, Patrik and Villanueva-Perez, Pablo LU
- organization
- publishing date
- 2022-03-28
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Optics Express
- volume
- 30
- issue
- 7
- pages
- 12 pages
- publisher
- Optical Society of America
- external identifiers
-
- scopus:85126678939
- pmid:35473025
- ISSN
- 1094-4087
- DOI
- 10.1364/OE.451914
- language
- English
- LU publication?
- yes
- additional info
- Publisher Copyright: © 2022 OSA - The Optical Society. All rights reserved.
- id
- 16b5ea02-f2a8-4cd5-9d87-39638f5163e2
- date added to LUP
- 2022-04-28 14:58:08
- date last changed
- 2024-06-17 13:05:01
@article{16b5ea02-f2a8-4cd5-9d87-39638f5163e2, abstract = {{<p>X-ray free-electron lasers (XFELs) provide high-brilliance pulses, which offer unique opportunities for coherent X-ray imaging techniques, such as in-line holography. One of the fundamental steps to process in-line holographic data is flat-field correction, which mitigates imaging artifacts and, in turn, enables phase reconstructions. However, conventional flat-field correction approaches cannot correct single XFEL pulses due to the stochastic nature of the self-amplified spontaneous emission (SASE), the mechanism responsible for the high brilliance of XFELs. Here, we demonstrate on simulated and megahertz imaging data, measured at the European XFEL, the possibility of overcoming such a limitation by using two different methods based on principal component analysis and deep learning. These methods retrieve flat-field corrected images from individual frames by separating the sample and flat-field signal contributions; thus, enabling advanced phase-retrieval reconstructions. We anticipate that the proposed methods can be implemented in a real-time processing pipeline, which will enable online data analysis and phase reconstructions of coherent full-field imaging techniques such as in-line holography at XFELs.</p>}}, author = {{Buakor, Khachiwan and Zhang, Yuhe and Birnšteinova, Šarlota and Bellucci, Valerio and Sato, Takushi and Kirkwood, Henry and Mancuso, Adrian P. and Vagovic, Patrik and Villanueva-Perez, Pablo}}, issn = {{1094-4087}}, language = {{eng}}, month = {{03}}, number = {{7}}, pages = {{10633--10644}}, publisher = {{Optical Society of America}}, series = {{Optics Express}}, title = {{Shot-to-shot flat-field correction at X-ray free-electron lasers}}, url = {{http://dx.doi.org/10.1364/OE.451914}}, doi = {{10.1364/OE.451914}}, volume = {{30}}, year = {{2022}}, }