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Shot-to-shot flat-field correction at X-ray free-electron lasers

Buakor, Khachiwan ; Zhang, Yuhe LU ; Birnšteinova, Šarlota ; Bellucci, Valerio ; Sato, Takushi ; Kirkwood, Henry ; Mancuso, Adrian P. ; Vagovic, Patrik and Villanueva-Perez, Pablo LU orcid (2022) In Optics Express 30(7). p.10633-10644
Abstract

X-ray free-electron lasers (XFELs) provide high-brilliance pulses, which offer unique opportunities for coherent X-ray imaging techniques, such as in-line holography. One of the fundamental steps to process in-line holographic data is flat-field correction, which mitigates imaging artifacts and, in turn, enables phase reconstructions. However, conventional flat-field correction approaches cannot correct single XFEL pulses due to the stochastic nature of the self-amplified spontaneous emission (SASE), the mechanism responsible for the high brilliance of XFELs. Here, we demonstrate on simulated and megahertz imaging data, measured at the European XFEL, the possibility of overcoming such a limitation by using two different methods based on... (More)

X-ray free-electron lasers (XFELs) provide high-brilliance pulses, which offer unique opportunities for coherent X-ray imaging techniques, such as in-line holography. One of the fundamental steps to process in-line holographic data is flat-field correction, which mitigates imaging artifacts and, in turn, enables phase reconstructions. However, conventional flat-field correction approaches cannot correct single XFEL pulses due to the stochastic nature of the self-amplified spontaneous emission (SASE), the mechanism responsible for the high brilliance of XFELs. Here, we demonstrate on simulated and megahertz imaging data, measured at the European XFEL, the possibility of overcoming such a limitation by using two different methods based on principal component analysis and deep learning. These methods retrieve flat-field corrected images from individual frames by separating the sample and flat-field signal contributions; thus, enabling advanced phase-retrieval reconstructions. We anticipate that the proposed methods can be implemented in a real-time processing pipeline, which will enable online data analysis and phase reconstructions of coherent full-field imaging techniques such as in-line holography at XFELs.

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author
; ; ; ; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Optics Express
volume
30
issue
7
pages
12 pages
publisher
Optical Society of America
external identifiers
  • scopus:85126678939
  • pmid:35473025
ISSN
1094-4087
DOI
10.1364/OE.451914
language
English
LU publication?
yes
additional info
Publisher Copyright: © 2022 OSA - The Optical Society. All rights reserved.
id
16b5ea02-f2a8-4cd5-9d87-39638f5163e2
date added to LUP
2022-04-28 14:58:08
date last changed
2024-06-17 13:05:01
@article{16b5ea02-f2a8-4cd5-9d87-39638f5163e2,
  abstract     = {{<p>X-ray free-electron lasers (XFELs) provide high-brilliance pulses, which offer unique opportunities for coherent X-ray imaging techniques, such as in-line holography. One of the fundamental steps to process in-line holographic data is flat-field correction, which mitigates imaging artifacts and, in turn, enables phase reconstructions. However, conventional flat-field correction approaches cannot correct single XFEL pulses due to the stochastic nature of the self-amplified spontaneous emission (SASE), the mechanism responsible for the high brilliance of XFELs. Here, we demonstrate on simulated and megahertz imaging data, measured at the European XFEL, the possibility of overcoming such a limitation by using two different methods based on principal component analysis and deep learning. These methods retrieve flat-field corrected images from individual frames by separating the sample and flat-field signal contributions; thus, enabling advanced phase-retrieval reconstructions. We anticipate that the proposed methods can be implemented in a real-time processing pipeline, which will enable online data analysis and phase reconstructions of coherent full-field imaging techniques such as in-line holography at XFELs.</p>}},
  author       = {{Buakor, Khachiwan and Zhang, Yuhe and Birnšteinova, Šarlota and Bellucci, Valerio and Sato, Takushi and Kirkwood, Henry and Mancuso, Adrian P. and Vagovic, Patrik and Villanueva-Perez, Pablo}},
  issn         = {{1094-4087}},
  language     = {{eng}},
  month        = {{03}},
  number       = {{7}},
  pages        = {{10633--10644}},
  publisher    = {{Optical Society of America}},
  series       = {{Optics Express}},
  title        = {{Shot-to-shot flat-field correction at X-ray free-electron lasers}},
  url          = {{http://dx.doi.org/10.1364/OE.451914}},
  doi          = {{10.1364/OE.451914}},
  volume       = {{30}},
  year         = {{2022}},
}