X-ray scattering tensor tomography with circular gratings
Kim, Jisoo ; Kagias, Matias LU
; Marone, Federica
and Stampanoni, Marco
(2020)
In Applied Physics Letters
116(13).
- Abstract
Three dimensional (3D) information of the microstructure organization of various relevant materials in industry and nature is fundamental to master the understanding of their macroscopic properties. X-ray scattering tensor tomography provides 3D directional information on unresolved microstructures in large volumes, facilitating the investigation of the microstructural organization in statistically large enough sample portions. However, established acquisition protocols such as scanning small angle x-ray scattering and x-ray grating interferometry require long measurement time. In this Letter, a rapid x-ray scattering tensor tomography acquisition method is proposed. It is based on circular gratings, which provide single-shot... (More)
Three dimensional (3D) information of the microstructure organization of various relevant materials in industry and nature is fundamental to master the understanding of their macroscopic properties. X-ray scattering tensor tomography provides 3D directional information on unresolved microstructures in large volumes, facilitating the investigation of the microstructural organization in statistically large enough sample portions. However, established acquisition protocols such as scanning small angle x-ray scattering and x-ray grating interferometry require long measurement time. In this Letter, a rapid x-ray scattering tensor tomography acquisition method is proposed. It is based on circular gratings, which provide single-shot 2D-omnidirectional information of the sample scattering properties. The main advantage of the presented method is the reduced data acquisition time compared to the existing protocols for x-ray scattering tensor tomography, paving the way toward rapid time-resolved studies.
(Less)
- author
- Kim, Jisoo
; Kagias, Matias
LU
; Marone, Federica
and Stampanoni, Marco
- publishing date
- 2020-03-30
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Applied Physics Letters
- volume
- 116
- issue
- 13
- article number
- 134102
- publisher
- American Institute of Physics (AIP)
- external identifiers
-
- scopus:85083029400
- ISSN
- 0003-6951
- DOI
- 10.1063/1.5145361
- language
- English
- LU publication?
- no
- additional info
- Publisher Copyright: © 2020 Author(s).
- id
- 1732a7bb-75c9-4f2e-ae62-eaf61593ddc5
- date added to LUP
- 2023-11-27 09:00:09
- date last changed
- 2024-06-06 18:40:48
@article{1732a7bb-75c9-4f2e-ae62-eaf61593ddc5,
abstract = {{<p>Three dimensional (3D) information of the microstructure organization of various relevant materials in industry and nature is fundamental to master the understanding of their macroscopic properties. X-ray scattering tensor tomography provides 3D directional information on unresolved microstructures in large volumes, facilitating the investigation of the microstructural organization in statistically large enough sample portions. However, established acquisition protocols such as scanning small angle x-ray scattering and x-ray grating interferometry require long measurement time. In this Letter, a rapid x-ray scattering tensor tomography acquisition method is proposed. It is based on circular gratings, which provide single-shot 2D-omnidirectional information of the sample scattering properties. The main advantage of the presented method is the reduced data acquisition time compared to the existing protocols for x-ray scattering tensor tomography, paving the way toward rapid time-resolved studies.</p>}},
author = {{Kim, Jisoo and Kagias, Matias and Marone, Federica and Stampanoni, Marco}},
issn = {{0003-6951}},
language = {{eng}},
month = {{03}},
number = {{13}},
publisher = {{American Institute of Physics (AIP)}},
series = {{Applied Physics Letters}},
title = {{X-ray scattering tensor tomography with circular gratings}},
url = {{http://dx.doi.org/10.1063/1.5145361}},
doi = {{10.1063/1.5145361}},
volume = {{116}},
year = {{2020}},
}