Advanced

PIXE Analysis of Samples of Intermediate Thickness

Carlsson, Lars-Eric ; Malmqvist, Klas LU ; Johansson, Gerd LU and Akselsson, Roland LU (1981) In Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment 181(1-3). p.179-183
Abstract
A procedure for making accurate matrix corrections in PIXE analyses of samples of intermediate thickness has been developed. The transmission of a collimated X-ray beam through different parts of the sample is measured with a Si(Li) detector to determine the thickness and shape of the sample. Experiments have been performed using uniform polymer foils doped with known concentrations of different elements and with thicknesses ranging from 1.5 to 11 mg/cm2. The results from these samples indicate that the accuracy of the correction procedure is better than 5%. The correction procedure has been applied to, e.g., samples obtained in single orifice cascade impactors.
Please use this url to cite or link to this publication:
author
; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
PIXE, thickness corrections
in
Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
volume
181
issue
1-3
pages
179 - 183
publisher
Elsevier
ISSN
0167-5087
DOI
10.1016/0029-554X(81)90602-9
language
English
LU publication?
yes
additional info
The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Nuclear Physics (Faculty of Technology) (011013007), Ergonomics and Aerosol Technology (011025002)
id
fc64898c-9291-42e4-bc91-52ad9b1ce935 (old id 1745022)
date added to LUP
2016-04-04 11:33:25
date last changed
2020-12-07 04:00:22
@article{fc64898c-9291-42e4-bc91-52ad9b1ce935,
  abstract     = {A procedure for making accurate matrix corrections in PIXE analyses of samples of intermediate thickness has been developed. The transmission of a collimated X-ray beam through different parts of the sample is measured with a Si(Li) detector to determine the thickness and shape of the sample. Experiments have been performed using uniform polymer foils doped with known concentrations of different elements and with thicknesses ranging from 1.5 to 11 mg/cm2. The results from these samples indicate that the accuracy of the correction procedure is better than 5%. The correction procedure has been applied to, e.g., samples obtained in single orifice cascade impactors.},
  author       = {Carlsson, Lars-Eric and Malmqvist, Klas and Johansson, Gerd and Akselsson, Roland},
  issn         = {0167-5087},
  language     = {eng},
  number       = {1-3},
  pages        = {179--183},
  publisher    = {Elsevier},
  series       = {Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment},
  title        = {PIXE Analysis of Samples of Intermediate Thickness},
  url          = {http://dx.doi.org/10.1016/0029-554X(81)90602-9},
  doi          = {10.1016/0029-554X(81)90602-9},
  volume       = {181},
  year         = {1981},
}