PIXE Analysis of Samples of Intermediate Thickness
(1981) In Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment 181(1-3). p.179-183- Abstract
- A procedure for making accurate matrix corrections in PIXE analyses of samples of intermediate thickness has been developed. The transmission of a collimated X-ray beam through different parts of the sample is measured with a Si(Li) detector to determine the thickness and shape of the sample. Experiments have been performed using uniform polymer foils doped with known concentrations of different elements and with thicknesses ranging from 1.5 to 11 mg/cm2. The results from these samples indicate that the accuracy of the correction procedure is better than 5%. The correction procedure has been applied to, e.g., samples obtained in single orifice cascade impactors.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/1745022
- author
- Carlsson, Lars-Eric ; Malmqvist, Klas LU ; Johansson, Gerd LU and Akselsson, Roland LU
- organization
- publishing date
- 1981
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- PIXE, thickness corrections
- in
- Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
- volume
- 181
- issue
- 1-3
- pages
- 179 - 183
- publisher
- Elsevier
- external identifiers
-
- scopus:19244367657
- ISSN
- 0167-5087
- DOI
- 10.1016/0029-554X(81)90602-9
- language
- English
- LU publication?
- yes
- additional info
- The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Nuclear Physics (Faculty of Technology) (011013007), Ergonomics and Aerosol Technology (011025002)
- id
- fc64898c-9291-42e4-bc91-52ad9b1ce935 (old id 1745022)
- date added to LUP
- 2016-04-04 11:33:25
- date last changed
- 2021-12-06 04:00:46
@article{fc64898c-9291-42e4-bc91-52ad9b1ce935, abstract = {{A procedure for making accurate matrix corrections in PIXE analyses of samples of intermediate thickness has been developed. The transmission of a collimated X-ray beam through different parts of the sample is measured with a Si(Li) detector to determine the thickness and shape of the sample. Experiments have been performed using uniform polymer foils doped with known concentrations of different elements and with thicknesses ranging from 1.5 to 11 mg/cm2. The results from these samples indicate that the accuracy of the correction procedure is better than 5%. The correction procedure has been applied to, e.g., samples obtained in single orifice cascade impactors.}}, author = {{Carlsson, Lars-Eric and Malmqvist, Klas and Johansson, Gerd and Akselsson, Roland}}, issn = {{0167-5087}}, keywords = {{PIXE; thickness corrections}}, language = {{eng}}, number = {{1-3}}, pages = {{179--183}}, publisher = {{Elsevier}}, series = {{Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment}}, title = {{PIXE Analysis of Samples of Intermediate Thickness}}, url = {{http://dx.doi.org/10.1016/0029-554X(81)90602-9}}, doi = {{10.1016/0029-554X(81)90602-9}}, volume = {{181}}, year = {{1981}}, }