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BASTION: Board and SoC test instrumentation for ageing and no failure found

Jutman, Artur; Lotz, Christophe; Larsson, Erik LU ; Sonza Reorda, Matteo; Jenihhin, Maksim; Raik, Jaan; Kerkhoff, Hans ; Krenz-Baath, Rene and Engelke, Piet (2017) In 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.115-120
Abstract
This is an overview paper that motivates and describes performed work done in the European Commission funded research project BASTION, which focuses on two critical problems of modern electronics: the No-Fault-Found (NFF) and CMOS ageing. New defect classes contributing to NFF have been identified, including timing related faults (TRF) at board level and intermittent resistive faults (IRF) at IC level. BASTION has addressed the mechanisms of ageing and developed several techniques to improve the longevity of electronic products. Embedded Instrumentation, monitors, and IEEE 1687 standard for reconfigurable scan networks (RSN) are seen as an important leverage that helped mitigating the impact of the above listed problems by facilitating a... (More)
This is an overview paper that motivates and describes performed work done in the European Commission funded research project BASTION, which focuses on two critical problems of modern electronics: the No-Fault-Found (NFF) and CMOS ageing. New defect classes contributing to NFF have been identified, including timing related faults (TRF) at board level and intermittent resistive faults (IRF) at IC level. BASTION has addressed the mechanisms of ageing and developed several techniques to improve the longevity of electronic products. Embedded Instrumentation, monitors, and IEEE 1687 standard for reconfigurable scan networks (RSN) are seen as an important leverage that helped mitigating the impact of the above listed problems by facilitating a low-latency, scalable online system health monitoring and error localization infrastructure as well as integration of all heterogeneous technologies into a homogeneous demonstration platform. This paper helps the reader to get a general overview of the work performed and provides a collection of references to publications where the respective research results are described in detail. (Less)
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author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
in
2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)
pages
115 - 120
publisher
Institute of Electrical and Electronics Engineers Inc.
external identifiers
  • scopus:85020218651
DOI
10.23919/DATE.2017.7926968
language
English
LU publication?
yes
id
1782369e-7659-4052-89a4-4c95418f2887
date added to LUP
2017-06-07 12:47:48
date last changed
2017-07-02 05:02:46
@inproceedings{1782369e-7659-4052-89a4-4c95418f2887,
  abstract     = {This is an overview paper that motivates and describes performed work done in the European Commission funded research project BASTION, which focuses on two critical problems of modern electronics: the No-Fault-Found (NFF) and CMOS ageing. New defect classes contributing to NFF have been identified, including timing related faults (TRF) at board level and intermittent resistive faults (IRF) at IC level. BASTION has addressed the mechanisms of ageing and developed several techniques to improve the longevity of electronic products. Embedded Instrumentation, monitors, and IEEE 1687 standard for reconfigurable scan networks (RSN) are seen as an important leverage that helped mitigating the impact of the above listed problems by facilitating a low-latency, scalable online system health monitoring and error localization infrastructure as well as integration of all heterogeneous technologies into a homogeneous demonstration platform. This paper helps the reader to get a general overview of the work performed and provides a collection of references to publications where the respective research results are described in detail.},
  author       = {Jutman, Artur and Lotz, Christophe and Larsson, Erik and Sonza Reorda, Matteo and Jenihhin, Maksim and Raik, Jaan and Kerkhoff, Hans  and Krenz-Baath, Rene and Engelke, Piet},
  booktitle    = {2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)},
  language     = {eng},
  pages        = {115--120},
  publisher    = {Institute of Electrical and Electronics Engineers Inc.},
  title        = {BASTION: Board and SoC test instrumentation for ageing and no failure found},
  url          = {http://dx.doi.org/10.23919/DATE.2017.7926968},
  year         = {2017},
}