Nonlinear electrical properties of Si three-terminal junction devices
(2010) In Applied Physics Letters 97(24).- Abstract
- This letter reports on the realization and characterization of silicon three-terminal junction devices made in a silicon-on-insulator wafer. Room temperature electrical measurements show that the fabricated devices exhibit pronounced nonlinear electrical properties inherent to ballistic electron transport in a three-terminal ballistic junction (TBJ) device. The results show that room temperature functional TBJ devices can be realized in a semiconductor material other than high-mobility III-V semiconductor heterostructures and provide a simple design principle for compact silicon devices in nanoelectronics. (C) 2010 American Institute of Physics. [doi:10.1063/1.3526725]
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/1831254
- author
- Meng, Fantao ; Sun, Jie LU ; Graczyk, Mariusz LU ; Zhang, Kailiang ; Prunnila, Mika ; Ahopelto, Jouni ; Shi, Peixiong ; Chu, Jinkui ; Maximov, Ivan LU and Xu, Hongqi LU
- organization
- publishing date
- 2010
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Applied Physics Letters
- volume
- 97
- issue
- 24
- article number
- 242106
- publisher
- American Institute of Physics (AIP)
- external identifiers
-
- wos:000285481000031
- scopus:78650376760
- ISSN
- 0003-6951
- DOI
- 10.1063/1.3526725
- language
- English
- LU publication?
- yes
- id
- 0ab4acf6-d38f-49f9-bda3-121030efbb9a (old id 1831254)
- date added to LUP
- 2016-04-01 09:50:07
- date last changed
- 2022-04-27 08:01:53
@article{0ab4acf6-d38f-49f9-bda3-121030efbb9a, abstract = {{This letter reports on the realization and characterization of silicon three-terminal junction devices made in a silicon-on-insulator wafer. Room temperature electrical measurements show that the fabricated devices exhibit pronounced nonlinear electrical properties inherent to ballistic electron transport in a three-terminal ballistic junction (TBJ) device. The results show that room temperature functional TBJ devices can be realized in a semiconductor material other than high-mobility III-V semiconductor heterostructures and provide a simple design principle for compact silicon devices in nanoelectronics. (C) 2010 American Institute of Physics. [doi:10.1063/1.3526725]}}, author = {{Meng, Fantao and Sun, Jie and Graczyk, Mariusz and Zhang, Kailiang and Prunnila, Mika and Ahopelto, Jouni and Shi, Peixiong and Chu, Jinkui and Maximov, Ivan and Xu, Hongqi}}, issn = {{0003-6951}}, language = {{eng}}, number = {{24}}, publisher = {{American Institute of Physics (AIP)}}, series = {{Applied Physics Letters}}, title = {{Nonlinear electrical properties of Si three-terminal junction devices}}, url = {{http://dx.doi.org/10.1063/1.3526725}}, doi = {{10.1063/1.3526725}}, volume = {{97}}, year = {{2010}}, }