Electrical and mechanical behaviour of metal thin films with deformation-induced cracks predicted by computational homogenisation
(2021) In International Journal of Fracture 231(2). p.223-242- Abstract
Motivated by advances in flexible electronic technologies and by the endeavour to develop non-destructive testing methods, this article analyses the capability of computational multiscale formulations to predict the influence of microscale cracks on effective macroscopic electrical and mechanical material properties. To this end, thin metal films under mechanical load are experimentally analysed by using in-situ confocal laser scanning microscopy (CLSM) and in-situ four point probe resistance measurements. Image processing techniques are then used to generate representative volume elements from the laser intensity images. These discrete representations of the crack pattern at the microscale serve as the basis for the calculation of... (More)
Motivated by advances in flexible electronic technologies and by the endeavour to develop non-destructive testing methods, this article analyses the capability of computational multiscale formulations to predict the influence of microscale cracks on effective macroscopic electrical and mechanical material properties. To this end, thin metal films under mechanical load are experimentally analysed by using in-situ confocal laser scanning microscopy (CLSM) and in-situ four point probe resistance measurements. Image processing techniques are then used to generate representative volume elements from the laser intensity images. These discrete representations of the crack pattern at the microscale serve as the basis for the calculation of effective macroscopic electrical conductivity and mechanical stiffness tensors by means of computational homogenisation approaches. A comparison of simulation results with experimental electrical resistance measurements and a detailed study of fundamental numerical properties demonstrates the applicability of the proposed approach. In particular, the (numerical) errors that are induced by the representative volume element size and by the finite element discretisation are studied, and the influence of the filter that is used in the generation process of the representative volume element is analysed.
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- author
- Kaiser, T. ; Cordill, M. J. ; Kirchlechner, C. and Menzel, A. LU
- organization
- publishing date
- 2021-10-01
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- Anisotropic conductivity, Computational homogenisation, Computational multiscale simulations, Electrical resistance, Heterogeneous microstructures, Microcracking, Scale-bridging
- in
- International Journal of Fracture
- volume
- 231
- issue
- 2
- pages
- 20 pages
- publisher
- Springer
- external identifiers
-
- scopus:85116410843
- ISSN
- 0376-9429
- DOI
- 10.1007/s10704-021-00582-3
- language
- English
- LU publication?
- yes
- additional info
- Publisher Copyright: © 2021, The Author(s).
- id
- 185a8ebe-81c7-4017-83fe-d591e49c0385
- date added to LUP
- 2021-10-28 14:19:07
- date last changed
- 2025-04-04 14:42:36
@article{185a8ebe-81c7-4017-83fe-d591e49c0385,
abstract = {{<p>Motivated by advances in flexible electronic technologies and by the endeavour to develop non-destructive testing methods, this article analyses the capability of computational multiscale formulations to predict the influence of microscale cracks on effective macroscopic electrical and mechanical material properties. To this end, thin metal films under mechanical load are experimentally analysed by using in-situ confocal laser scanning microscopy (CLSM) and in-situ four point probe resistance measurements. Image processing techniques are then used to generate representative volume elements from the laser intensity images. These discrete representations of the crack pattern at the microscale serve as the basis for the calculation of effective macroscopic electrical conductivity and mechanical stiffness tensors by means of computational homogenisation approaches. A comparison of simulation results with experimental electrical resistance measurements and a detailed study of fundamental numerical properties demonstrates the applicability of the proposed approach. In particular, the (numerical) errors that are induced by the representative volume element size and by the finite element discretisation are studied, and the influence of the filter that is used in the generation process of the representative volume element is analysed.</p>}},
author = {{Kaiser, T. and Cordill, M. J. and Kirchlechner, C. and Menzel, A.}},
issn = {{0376-9429}},
keywords = {{Anisotropic conductivity; Computational homogenisation; Computational multiscale simulations; Electrical resistance; Heterogeneous microstructures; Microcracking; Scale-bridging}},
language = {{eng}},
month = {{10}},
number = {{2}},
pages = {{223--242}},
publisher = {{Springer}},
series = {{International Journal of Fracture}},
title = {{Electrical and mechanical behaviour of metal thin films with deformation-induced cracks predicted by computational homogenisation}},
url = {{http://dx.doi.org/10.1007/s10704-021-00582-3}},
doi = {{10.1007/s10704-021-00582-3}},
volume = {{231}},
year = {{2021}},
}