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Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters

Lundwall, M; Tchaplyguine, Maxim LU ; Ohrwall, G; Lindblad, A; Peredkov, Sergey LU ; Rander, T; Svensson, S and Bjorneholm, O (2005) In Surface Science 594(1-3). p.12-19
Abstract
The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
photoelectron, Auger ejection, photoelectron spectroscopy, spectroscopy, Auger electron, surface sensitivity, effective attenuation length-, synchrotron radiation photoelectron spectroscopy, emission
in
Surface Science
volume
594
issue
1-3
pages
12 - 19
publisher
Elsevier
external identifiers
  • wos:000232992100002
  • scopus:27144484440
ISSN
0039-6028
DOI
10.1016/j.susc.2005.07.007
language
English
LU publication?
yes
id
aeeea176-a399-4455-8ef8-4ed92c996a10 (old id 214102)
date added to LUP
2007-08-10 14:40:08
date last changed
2017-01-01 07:15:40
@article{aeeea176-a399-4455-8ef8-4ed92c996a10,
  abstract     = {The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.},
  author       = {Lundwall, M and Tchaplyguine, Maxim and Ohrwall, G and Lindblad, A and Peredkov, Sergey and Rander, T and Svensson, S and Bjorneholm, O},
  issn         = {0039-6028},
  keyword      = {photoelectron,Auger ejection,photoelectron spectroscopy,spectroscopy,Auger electron,surface sensitivity,effective attenuation length-,synchrotron radiation photoelectron spectroscopy,emission},
  language     = {eng},
  number       = {1-3},
  pages        = {12--19},
  publisher    = {Elsevier},
  series       = {Surface Science},
  title        = {Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters},
  url          = {http://dx.doi.org/10.1016/j.susc.2005.07.007},
  volume       = {594},
  year         = {2005},
}