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Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam

Gaudin, J. ; Keitel, B. ; Jurgilaitis, Andrius LU ; Nüske, Ralf LU ; Guerin, L. ; Larsson, Jörgen LU orcid ; Mann, K. ; Schaefer, B. ; Tiedtke, K. and Trapp, A. , et al. (2011) In Optics Express 19(16). p.15516-15524
Abstract
We present results of a time-resolved pump-probe experiment where a Si sample was exposed to an intense 15 keV beam and its surface monitored by measuring the wavefront deformation of a reflected optical laser probe beam. By reconstructing and back propagating the wavefront, the deformed surface can be retrieved for each time step. The dynamics of the heat bump, build-up and relaxation, is followed with a spatial resolution in the nanometer range. The results are interpreted taking into account results of finite element method simulations. Due to its robustness and simplicity this method should find further developments at new x-ray light sources (FEL) or be used to gain understanding on thermo-dynamical behavior of highly excited... (More)
We present results of a time-resolved pump-probe experiment where a Si sample was exposed to an intense 15 keV beam and its surface monitored by measuring the wavefront deformation of a reflected optical laser probe beam. By reconstructing and back propagating the wavefront, the deformed surface can be retrieved for each time step. The dynamics of the heat bump, build-up and relaxation, is followed with a spatial resolution in the nanometer range. The results are interpreted taking into account results of finite element method simulations. Due to its robustness and simplicity this method should find further developments at new x-ray light sources (FEL) or be used to gain understanding on thermo-dynamical behavior of highly excited materials. (C) 2011 Optical Society of America (Less)
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organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Optics Express
volume
19
issue
16
pages
15516 - 15524
publisher
Optical Society of America
external identifiers
  • wos:000293339200077
  • scopus:79961088453
ISSN
1094-4087
DOI
10.1364/OE.19.015516
language
English
LU publication?
yes
id
74ddd0d0-1ad9-44d1-b81a-f9d6e812ba0b (old id 2161907)
date added to LUP
2016-04-01 13:05:26
date last changed
2021-02-17 01:55:37
@article{74ddd0d0-1ad9-44d1-b81a-f9d6e812ba0b,
  abstract     = {We present results of a time-resolved pump-probe experiment where a Si sample was exposed to an intense 15 keV beam and its surface monitored by measuring the wavefront deformation of a reflected optical laser probe beam. By reconstructing and back propagating the wavefront, the deformed surface can be retrieved for each time step. The dynamics of the heat bump, build-up and relaxation, is followed with a spatial resolution in the nanometer range. The results are interpreted taking into account results of finite element method simulations. Due to its robustness and simplicity this method should find further developments at new x-ray light sources (FEL) or be used to gain understanding on thermo-dynamical behavior of highly excited materials. (C) 2011 Optical Society of America},
  author       = {Gaudin, J. and Keitel, B. and Jurgilaitis, Andrius and Nüske, Ralf and Guerin, L. and Larsson, Jörgen and Mann, K. and Schaefer, B. and Tiedtke, K. and Trapp, A. and Tschentscher, Th and Yang, F. and Wulff, M. and Sinn, H. and Floeter, B.},
  issn         = {1094-4087},
  language     = {eng},
  number       = {16},
  pages        = {15516--15524},
  publisher    = {Optical Society of America},
  series       = {Optics Express},
  title        = {Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam},
  url          = {https://lup.lub.lu.se/search/files/3153570/2426299.pdf},
  doi          = {10.1364/OE.19.015516},
  volume       = {19},
  year         = {2011},
}