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Reactions and luminescence in passivated Si nanocrystallites induced by vacuum ultraviolet and soft-x-ray photons

Chao, Y; Krishnamurthy, S; Montalti, M; Lie, LH; Houlton, A; Horrocks, BR; Kjeldgaard, Lisbeth LU ; Dhanak, VR; Hunt, MRC and Siller, L (2005) In Applied Physics Reviews 98(4).
Abstract
Alkyl-modified silicon nanocrystallites are efficient fluorophores which are of interest for fundamental spectroscopic studies and as luminescent probes in biology because of their stability in aqueous media. In this work we have investigated these particles using scanning tunneling microscopy, synchrotron-radiation excited photoemission, and x-ray excited optical luminescence (XEOL). During the course of illumination with 145-eV photons we have monitored the evolution of the Si2p core level and, in samples which have suffered prolonged atmospheric exposure, observed in real time the growth of an extra Si2p component attributed to in situ photoinduced oxidation of the Si nanocrystallites. XEOL reveals that two emission bands are active... (More)
Alkyl-modified silicon nanocrystallites are efficient fluorophores which are of interest for fundamental spectroscopic studies and as luminescent probes in biology because of their stability in aqueous media. In this work we have investigated these particles using scanning tunneling microscopy, synchrotron-radiation excited photoemission, and x-ray excited optical luminescence (XEOL). During the course of illumination with 145-eV photons we have monitored the evolution of the Si2p core level and, in samples which have suffered prolonged atmospheric exposure, observed in real time the growth of an extra Si2p component attributed to in situ photoinduced oxidation of the Si nanocrystallites. XEOL reveals that two emission bands are active upon soft-x-ray photon excitation and that photoluminescence intensity decreases with photon exposure, which is attributed to charge trapping within the film. (Less)
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics Reviews
volume
98
issue
4
publisher
American Institute of Physics
external identifiers
  • wos:000231551700093
  • scopus:25144480353
ISSN
0021-8979
DOI
10.1063/1.2012511
language
English
LU publication?
yes
id
3071bc30-28f4-4a6e-9794-f079299177f8 (old id 226296)
date added to LUP
2007-08-23 13:02:27
date last changed
2017-01-01 04:24:38
@article{3071bc30-28f4-4a6e-9794-f079299177f8,
  abstract     = {Alkyl-modified silicon nanocrystallites are efficient fluorophores which are of interest for fundamental spectroscopic studies and as luminescent probes in biology because of their stability in aqueous media. In this work we have investigated these particles using scanning tunneling microscopy, synchrotron-radiation excited photoemission, and x-ray excited optical luminescence (XEOL). During the course of illumination with 145-eV photons we have monitored the evolution of the Si2p core level and, in samples which have suffered prolonged atmospheric exposure, observed in real time the growth of an extra Si2p component attributed to in situ photoinduced oxidation of the Si nanocrystallites. XEOL reveals that two emission bands are active upon soft-x-ray photon excitation and that photoluminescence intensity decreases with photon exposure, which is attributed to charge trapping within the film.},
  author       = {Chao, Y and Krishnamurthy, S and Montalti, M and Lie, LH and Houlton, A and Horrocks, BR and Kjeldgaard, Lisbeth and Dhanak, VR and Hunt, MRC and Siller, L},
  issn         = {0021-8979},
  language     = {eng},
  number       = {4},
  publisher    = {American Institute of Physics},
  series       = {Applied Physics Reviews},
  title        = {Reactions and luminescence in passivated Si nanocrystallites induced by vacuum ultraviolet and soft-x-ray photons},
  url          = {http://dx.doi.org/10.1063/1.2012511},
  volume       = {98},
  year         = {2005},
}