Measurement Point Selection for In-Operation Wear-Out Monitoring
(2011) 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS11)- Abstract
- In recent IC designs, the risk of early failure due to electromigration wear-out has increased due to reduced feature dimensions. To give a warning of impending failure, wearout monitoring approaches have included delay measurement circuitry on-chip. Due to the high cost of delay measurement circuitry this paper presents a method to reduce the number of necessary measurement points. The proposed method is based on identification of wear-out sensitive interconnects and selects a small number of measurement points that can be used to observe the state of all the wear-out sensitive interconnects. The method is demonstrated on ISCAS85 benchmark ICs with encouraging results.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2340790
- author
- Ingelsson, Urban ; Chang, Shih-Yen and Larsson, Erik LU
- publishing date
- 2011
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS11)
- conference name
- 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS11)
- conference dates
- 2011-04-13 - 2011-04-15
- external identifiers
-
- scopus:79959975113
- ISBN
- 978-1-4244-9755-3
- DOI
- 10.1109/DDECS.2011.5783115
- language
- English
- LU publication?
- no
- id
- 75060357-3d78-4e74-bef2-a49cef032e15 (old id 2340790)
- date added to LUP
- 2016-04-04 13:24:30
- date last changed
- 2022-01-30 02:38:59
@inproceedings{75060357-3d78-4e74-bef2-a49cef032e15, abstract = {{In recent IC designs, the risk of early failure due to electromigration wear-out has increased due to reduced feature dimensions. To give a warning of impending failure, wearout monitoring approaches have included delay measurement circuitry on-chip. Due to the high cost of delay measurement circuitry this paper presents a method to reduce the number of necessary measurement points. The proposed method is based on identification of wear-out sensitive interconnects and selects a small number of measurement points that can be used to observe the state of all the wear-out sensitive interconnects. The method is demonstrated on ISCAS85 benchmark ICs with encouraging results.}}, author = {{Ingelsson, Urban and Chang, Shih-Yen and Larsson, Erik}}, booktitle = {{14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS11)}}, isbn = {{978-1-4244-9755-3}}, language = {{eng}}, title = {{Measurement Point Selection for In-Operation Wear-Out Monitoring}}, url = {{http://dx.doi.org/10.1109/DDECS.2011.5783115}}, doi = {{10.1109/DDECS.2011.5783115}}, year = {{2011}}, }