Graph Theoretic Approach for Scan Cell Reordering to Minimize Peak Shift Power
(2010) Great Lakes Symposium on VLSI (GLSVLSI'10), 2010 p.73-78- Abstract
- Scan circuit testing generally causes excessive switching activity compared to normal circuit operation. This excessive switching activity causes high peak and average power consumption. Higher peak power causes, supply voltage droop and excessive heat dissipation. This paper proposes a scan cell reordering methodology to minimize the peak power consumption during scan shift operation. The proposed methodology first formulate the problem as graph theoretic problem then solve it by a linear time heuristic. The experimental results show that the methodology is able to reduce up to 48% of peak power in compared to the solution provided by industrial tool.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2340833
- author
- Tudu, Jaynarayan T. ; Larsson, Erik LU ; Singh, Virendra and Fujiwara, Hideo
- publishing date
- 2010
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- GLSVLSI '10 Proceedings of the 20th symposium on Great lakes symposium on VLSI
- pages
- 73 - 78
- conference name
- Great Lakes Symposium on VLSI (GLSVLSI'10), 2010
- conference location
- Providence, United States
- conference dates
- 2010-05-16 - 2010-05-18
- external identifiers
-
- scopus:77954517874
- ISBN
- 978-1-4503-0012-4
- DOI
- 10.1145/1785481.1785499
- language
- English
- LU publication?
- no
- id
- c2ae2e36-3636-4133-8ea5-c1a127aee2b8 (old id 2340833)
- date added to LUP
- 2016-04-04 14:27:16
- date last changed
- 2022-01-30 02:39:00
@inproceedings{c2ae2e36-3636-4133-8ea5-c1a127aee2b8, abstract = {{Scan circuit testing generally causes excessive switching activity compared to normal circuit operation. This excessive switching activity causes high peak and average power consumption. Higher peak power causes, supply voltage droop and excessive heat dissipation. This paper proposes a scan cell reordering methodology to minimize the peak power consumption during scan shift operation. The proposed methodology first formulate the problem as graph theoretic problem then solve it by a linear time heuristic. The experimental results show that the methodology is able to reduce up to 48% of peak power in compared to the solution provided by industrial tool.}}, author = {{Tudu, Jaynarayan T. and Larsson, Erik and Singh, Virendra and Fujiwara, Hideo}}, booktitle = {{GLSVLSI '10 Proceedings of the 20th symposium on Great lakes symposium on VLSI}}, isbn = {{978-1-4503-0012-4}}, language = {{eng}}, pages = {{73--78}}, title = {{Graph Theoretic Approach for Scan Cell Reordering to Minimize Peak Shift Power}}, url = {{http://dx.doi.org/10.1145/1785481.1785499}}, doi = {{10.1145/1785481.1785499}}, year = {{2010}}, }