Checking Pipelined Distributed Global Properties for Post-silicon Debug
Larsson, Erik LU
; Vermeulen, Bart
and Goossens, Kees
(2010)
IEEE Eleventh Workshop on RTL and High Level Testing, 2010
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2340869
- author
- Larsson, Erik
LU
; Vermeulen, Bart
and Goossens, Kees
- publishing date
- 2010
- type
- Contribution to conference
- publication status
- published
- subject
- conference name
- IEEE Eleventh Workshop on RTL and High Level Testing, 2010
- conference location
- Shanghai, China
- conference dates
- 2010-12-05 - 2012-12-06
- language
- English
- LU publication?
- no
- id
- 2cc46287-9e29-4e8e-8be8-dea987504069 (old id 2340869)
- date added to LUP
- 2016-04-04 13:34:36
- date last changed
- 2018-11-21 21:14:53
@misc{2cc46287-9e29-4e8e-8be8-dea987504069,
author = {{Larsson, Erik and Vermeulen, Bart and Goossens, Kees}},
language = {{eng}},
title = {{Checking Pipelined Distributed Global Properties for Post-silicon Debug}},
year = {{2010}},
}