Advanced

Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules

Vinay, N.S.; Rawat, Indira; Gaur, M.S.; Larsson, Erik LU and Singh, Virendra (2010) IEEE East-West Design and Test Symposium (EWDTS10) In Design & Test Symposium (EWDTS), 2010 East-West
Please use this url to cite or link to this publication:
author
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
in
Design & Test Symposium (EWDTS), 2010 East-West
conference name
IEEE East-West Design and Test Symposium (EWDTS10)
external identifiers
  • Scopus:79955954690
ISBN
978-1-4244-9555-9
DOI
10.1109/EWDTS.2010.5742053
language
English
LU publication?
no
id
4d055bb4-89c5-4133-80b8-b5b30377249b (old id 2340884)
date added to LUP
2012-02-10 13:51:06
date last changed
2017-01-01 08:22:47
@inproceedings{4d055bb4-89c5-4133-80b8-b5b30377249b,
  author       = {Vinay, N.S. and Rawat, Indira and Gaur, M.S. and Larsson, Erik and Singh, Virendra},
  booktitle    = {Design & Test Symposium (EWDTS), 2010 East-West},
  isbn         = {978-1-4244-9555-9},
  language     = {eng},
  title        = {Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules},
  url          = {http://dx.doi.org/10.1109/EWDTS.2010.5742053},
  year         = {2010},
}