Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC
Tudu, Jaynarayan T. ; Larsson, Erik LU
; Singh, Virendra
and Fujiwara, Hideo
(2009)
10th IEEE Workshop on RTL and High Level Testing (WRTLT'09)
p.43-48
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2340928
- author
- Tudu, Jaynarayan T.
; Larsson, Erik
LU
; Singh, Virendra
and Fujiwara, Hideo
- publishing date
- 2009
- type
- Contribution to conference
- publication status
- published
- subject
- pages
- 43 - 48
- conference name
- 10th IEEE Workshop on RTL and High Level Testing (WRTLT'09)
- conference location
- Hongkong, China
- conference dates
- 2009-11-27 - 2009-11-28
- language
- English
- LU publication?
- no
- id
- 2914a7f0-e4e3-489a-96a0-5fb1889474bc (old id 2340928)
- date added to LUP
- 2016-04-04 14:31:59
- date last changed
- 2018-11-21 21:20:51
@misc{2914a7f0-e4e3-489a-96a0-5fb1889474bc,
author = {{Tudu, Jaynarayan T. and Larsson, Erik and Singh, Virendra and Fujiwara, Hideo}},
language = {{eng}},
pages = {{43--48}},
title = {{Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC}},
year = {{2009}},
}