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Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC

Tudu, Jaynarayan T.; Larsson, Erik LU ; Singh, Virendra and Fujiwara, Hideo (2009) 10th IEEE Workshop on RTL and High Level Testing (WRTLT'09) p.43-48
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author
publishing date
type
Contribution to conference
publication status
published
subject
pages
43 - 48
conference name
10th IEEE Workshop on RTL and High Level Testing (WRTLT'09)
language
English
LU publication?
no
id
2914a7f0-e4e3-489a-96a0-5fb1889474bc (old id 2340928)
date added to LUP
2012-02-10 13:48:24
date last changed
2016-06-29 09:07:59
@misc{2914a7f0-e4e3-489a-96a0-5fb1889474bc,
  author       = {Tudu, Jaynarayan T. and Larsson, Erik and Singh, Virendra and Fujiwara, Hideo},
  language     = {eng},
  pages        = {43--48},
  title        = {Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC},
  year         = {2009},
}