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On Reduction of Capture Power for Modular System-on-Chip Test

Singh, Virendra and Larsson, Erik LU (2008) IEEE Workshop on RTL and High Level Testing WRTLT08
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author
publishing date
type
Contribution to conference
publication status
published
subject
keywords
modular system-on-chip, testing, power reduction
conference name
IEEE Workshop on RTL and High Level Testing WRTLT08
language
English
LU publication?
no
id
1533e5de-fd00-4401-94fa-36317edc605c (old id 2340955)
date added to LUP
2012-02-10 13:46:48
date last changed
2016-06-29 09:03:12
@misc{1533e5de-fd00-4401-94fa-36317edc605c,
  author       = {Singh, Virendra and Larsson, Erik},
  keyword      = {modular system-on-chip,testing,power reduction},
  language     = {eng},
  title        = {On Reduction of Capture Power for Modular System-on-Chip Test},
  year         = {2008},
}