Protocol Requirements in an SJTAG/IJTAG Environment
(2007) International Test Conference, 2007 p.1-3- Abstract
- Integrated Circuits, Printed Circuits Boards, and Multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol... (More)
- Integrated Circuits, Printed Circuits Boards, and Multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol requirements. We have taken the Standard Test and Programming Language (STAPL), which is built around a player (interpreter), and defined required extensions. The extensions have been implemented in an extended version of STAPL and we have made experiments with a PC acting as test controller and an FPGA being the DUT. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2341016
- author
- Carlsson, Gunnar ; Holmqvist, Johan and Larsson, Erik LU
- organization
- publishing date
- 2007
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- testing, Integrated Circuits, Printed Circuits Boards, Multi-board systems, test protocol
- host publication
- [Host publication title missing]
- pages
- 1 - 3
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- International Test Conference, 2007
- conference location
- Santa Clara, CA, United States
- conference dates
- 2007-10-21 - 2007-10-26
- external identifiers
-
- scopus:39749100675
- ISSN
- 1089-3539
- ISBN
- 978-1-4244-1127-6
- DOI
- 10.1109/TEST.2007.4437658
- language
- English
- LU publication?
- no
- id
- fec0070a-a9a9-4fbf-8079-de9a229d0bd6 (old id 2341016)
- date added to LUP
- 2016-04-01 17:02:44
- date last changed
- 2022-01-28 23:55:41
@inproceedings{fec0070a-a9a9-4fbf-8079-de9a229d0bd6, abstract = {{Integrated Circuits, Printed Circuits Boards, and Multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol requirements. We have taken the Standard Test and Programming Language (STAPL), which is built around a player (interpreter), and defined required extensions. The extensions have been implemented in an extended version of STAPL and we have made experiments with a PC acting as test controller and an FPGA being the DUT.}}, author = {{Carlsson, Gunnar and Holmqvist, Johan and Larsson, Erik}}, booktitle = {{[Host publication title missing]}}, isbn = {{978-1-4244-1127-6}}, issn = {{1089-3539}}, keywords = {{testing; Integrated Circuits; Printed Circuits Boards; Multi-board systems; test protocol}}, language = {{eng}}, pages = {{1--3}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, title = {{Protocol Requirements in an SJTAG/IJTAG Environment}}, url = {{http://dx.doi.org/10.1109/TEST.2007.4437658}}, doi = {{10.1109/TEST.2007.4437658}}, year = {{2007}}, }