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Protocol Requirements in an SJTAG/IJTAG Environment

Carlsson, Gunnar; Holmqvist, Johan and Larsson, Erik LU (2007) International Test Conference, 2007 In [Host publication title missing] p.1-3
Abstract
Integrated Circuits, Printed Circuits Boards, and Multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol... (More)
Integrated Circuits, Printed Circuits Boards, and Multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol requirements. We have taken the Standard Test and Programming Language (STAPL), which is built around a player (interpreter), and defined required extensions. The extensions have been implemented in an extended version of STAPL and we have made experiments with a PC acting as test controller and an FPGA being the DUT. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
testing, Integrated Circuits, Printed Circuits Boards, Multi-board systems, test protocol
in
[Host publication title missing]
pages
1 - 3
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
International Test Conference, 2007
external identifiers
  • scopus:39749100675
ISSN
1089-3539
ISBN
978-1-4244-1127-6
DOI
10.1109/TEST.2007.4437658
language
English
LU publication?
no
id
fec0070a-a9a9-4fbf-8079-de9a229d0bd6 (old id 2341016)
date added to LUP
2012-02-10 13:39:24
date last changed
2017-01-01 07:22:42
@inproceedings{fec0070a-a9a9-4fbf-8079-de9a229d0bd6,
  abstract     = {Integrated Circuits, Printed Circuits Boards, and Multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol requirements. We have taken the Standard Test and Programming Language (STAPL), which is built around a player (interpreter), and defined required extensions. The extensions have been implemented in an extended version of STAPL and we have made experiments with a PC acting as test controller and an FPGA being the DUT.},
  author       = {Carlsson, Gunnar and Holmqvist, Johan and Larsson, Erik},
  booktitle    = {[Host publication title missing]},
  isbn         = {978-1-4244-1127-6},
  issn         = {1089-3539},
  keyword      = {testing,Integrated Circuits,Printed Circuits Boards,Multi-board systems,test protocol},
  language     = {eng},
  pages        = {1--3},
  publisher    = {IEEE--Institute of Electrical and Electronics Engineers Inc.},
  title        = {Protocol Requirements in an SJTAG/IJTAG Environment},
  url          = {http://dx.doi.org/10.1109/TEST.2007.4437658},
  year         = {2007},
}