Optimized Integration of Test Compression and Sharing for SOC Testing
(2007) Design, Automation, and Test in Europe Conference DATE07 p.207-207- Abstract
- The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requirements. TAT and ATE memory requirement can be reduced by test architecture design, test scheduling, sharing the same tests among several cores, and test data compression. We propose, in contrast to previous work that addresses one or few of the problems, an integrated framework with heuristics for sharing and compression and a Constraint Logic Programming technique for architecture design and test scheduling that minimizes the TAT without violating a given ATE memory constraint. The significance of our approach is demonstrated by experiments with ITC-02 benchmark... (More)
- The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requirements. TAT and ATE memory requirement can be reduced by test architecture design, test scheduling, sharing the same tests among several cores, and test data compression. We propose, in contrast to previous work that addresses one or few of the problems, an integrated framework with heuristics for sharing and compression and a Constraint Logic Programming technique for architecture design and test scheduling that minimizes the TAT without violating a given ATE memory constraint. The significance of our approach is demonstrated by experiments with ITC-02 benchmark designs. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2341020
- author
- Larsson, Anders ; Larsson, Erik LU ; Eles, Petru Ion and Peng, Zebo
- publishing date
- 2007
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- testing, system-on-chip, SOC, test scheduling, memory requirements, test data compression, constraint logic programming
- host publication
- [Host publication title missing]
- pages
- 207 - 207
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- Design, Automation, and Test in Europe Conference DATE07
- conference location
- Nice, France
- conference dates
- 2007-04-16 - 2007-04-20
- external identifiers
-
- scopus:34548314162
- ISBN
- 978-3-9810801-2-4
- DOI
- 10.1109/DATE.2007.364592
- language
- English
- LU publication?
- no
- id
- ed253fa2-1e38-4323-b0ab-7ab9e5e2a07c (old id 2341020)
- date added to LUP
- 2016-04-04 11:19:33
- date last changed
- 2022-01-29 21:41:47
@inproceedings{ed253fa2-1e38-4323-b0ab-7ab9e5e2a07c, abstract = {{The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requirements. TAT and ATE memory requirement can be reduced by test architecture design, test scheduling, sharing the same tests among several cores, and test data compression. We propose, in contrast to previous work that addresses one or few of the problems, an integrated framework with heuristics for sharing and compression and a Constraint Logic Programming technique for architecture design and test scheduling that minimizes the TAT without violating a given ATE memory constraint. The significance of our approach is demonstrated by experiments with ITC-02 benchmark designs.}}, author = {{Larsson, Anders and Larsson, Erik and Eles, Petru Ion and Peng, Zebo}}, booktitle = {{[Host publication title missing]}}, isbn = {{978-3-9810801-2-4}}, keywords = {{testing; system-on-chip; SOC; test scheduling; memory requirements; test data compression; constraint logic programming}}, language = {{eng}}, pages = {{207--207}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, title = {{Optimized Integration of Test Compression and Sharing for SOC Testing}}, url = {{http://dx.doi.org/10.1109/DATE.2007.364592}}, doi = {{10.1109/DATE.2007.364592}}, year = {{2007}}, }