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Electrical properties and logic function of multibranch junction structures

Wallin, Daniel LU and Xu, Hongqi LU (2005) In Applied Physics Letters 86(25).
Abstract
We report on room-temperature electrical measurements of multibranch junction (MBJ) devices made from a semiconductor heterostructure. We show that the MBJ devices exhibit an interesting electrical property. If the voltage output at one branch is measured as a function of the voltages inputs to all the other branches, the output voltage is determined predominately by the most negative, or the lowest, voltage applied. The property arises from the nature of the voltage-induced ballistic electron transport in the MBJ device, and can in general be observed in other nanoscale MBJ structures. We also demonstrate the realization of very compact multi-input logic gates with the MBJ structures.
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics Letters
volume
86
issue
25
publisher
American Institute of Physics
external identifiers
  • wos:000229858300068
  • scopus:24344490314
ISSN
0003-6951
DOI
10.1063/1.1952579
language
English
LU publication?
yes
id
1289a125-90a1-432d-b5e3-f8c71aafd392 (old id 235919)
date added to LUP
2007-08-13 10:40:00
date last changed
2017-01-01 04:51:11
@article{1289a125-90a1-432d-b5e3-f8c71aafd392,
  abstract     = {We report on room-temperature electrical measurements of multibranch junction (MBJ) devices made from a semiconductor heterostructure. We show that the MBJ devices exhibit an interesting electrical property. If the voltage output at one branch is measured as a function of the voltages inputs to all the other branches, the output voltage is determined predominately by the most negative, or the lowest, voltage applied. The property arises from the nature of the voltage-induced ballistic electron transport in the MBJ device, and can in general be observed in other nanoscale MBJ structures. We also demonstrate the realization of very compact multi-input logic gates with the MBJ structures.},
  articleno    = {253515},
  author       = {Wallin, Daniel and Xu, Hongqi},
  issn         = {0003-6951},
  language     = {eng},
  number       = {25},
  publisher    = {American Institute of Physics},
  series       = {Applied Physics Letters},
  title        = {Electrical properties and logic function of multibranch junction structures},
  url          = {http://dx.doi.org/10.1063/1.1952579},
  volume       = {86},
  year         = {2005},
}