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Analysis of ultrafast X-ray diffraction data in a linear-chain model of the lattice dynamics

Herzog, M.; Schick, D.; Gaal, P.; Shayduk, R.; von Korff Schmising, Clemens LU and Bargheer, M. (2012) In Applied Physics A: Materials Science & Processing 106(3). p.489-499
Abstract
We present ultrafast X-ray diffraction (UXRD) experiments which sensitively probe impulsively excited acoustic phonons propagating in a SrRuO3/SrTiO3 superlattice and further into the substrate. These findings are discussed together with previous UXRD results (Herzog et al. in Appl. Phys. Lett. 96, 161906, 2010; Woerner et al. in Appl. Phys. A 96, 83, 2009; v. Korff Schmising in Phys. Rev. B 78, 060404(R), 2008 and in Appl. Phys. B 88, 1, 2007) using a normal-mode analysis of a linear-chain model of masses and springs, thus identifying them as linear-response phenomena. We point out the direct correspondence of calculated observables with X-ray signals. In this framework the complex lattice motion turns out to result from an interference... (More)
We present ultrafast X-ray diffraction (UXRD) experiments which sensitively probe impulsively excited acoustic phonons propagating in a SrRuO3/SrTiO3 superlattice and further into the substrate. These findings are discussed together with previous UXRD results (Herzog et al. in Appl. Phys. Lett. 96, 161906, 2010; Woerner et al. in Appl. Phys. A 96, 83, 2009; v. Korff Schmising in Phys. Rev. B 78, 060404(R), 2008 and in Appl. Phys. B 88, 1, 2007) using a normal-mode analysis of a linear-chain model of masses and springs, thus identifying them as linear-response phenomena. We point out the direct correspondence of calculated observables with X-ray signals. In this framework the complex lattice motion turns out to result from an interference of vibrational eigenmodes of the coupled system of nanolayers and substrate. UXRD in principle selectively measures the lattice motion occurring with a specific wavevector, however, each Bragg reflection only measures the amplitude of a delocalized phonon mode in a spatially localized region, determined by the nanocomposition of the sample or the extinction depth of X-rays. This leads to a decay of experimental signals although the excited modes survive. (Less)
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics A: Materials Science & Processing
volume
106
issue
3
pages
489 - 499
publisher
Springer
external identifiers
  • wos:000300260600004
  • scopus:84858794534
ISSN
1432-0630
DOI
10.1007/s00339-011-6719-z
language
English
LU publication?
yes
id
bea8c6ef-3c93-4b62-8dc0-11cd9ff03705 (old id 2403433)
date added to LUP
2012-03-28 12:56:37
date last changed
2017-09-10 03:03:11
@article{bea8c6ef-3c93-4b62-8dc0-11cd9ff03705,
  abstract     = {We present ultrafast X-ray diffraction (UXRD) experiments which sensitively probe impulsively excited acoustic phonons propagating in a SrRuO3/SrTiO3 superlattice and further into the substrate. These findings are discussed together with previous UXRD results (Herzog et al. in Appl. Phys. Lett. 96, 161906, 2010; Woerner et al. in Appl. Phys. A 96, 83, 2009; v. Korff Schmising in Phys. Rev. B 78, 060404(R), 2008 and in Appl. Phys. B 88, 1, 2007) using a normal-mode analysis of a linear-chain model of masses and springs, thus identifying them as linear-response phenomena. We point out the direct correspondence of calculated observables with X-ray signals. In this framework the complex lattice motion turns out to result from an interference of vibrational eigenmodes of the coupled system of nanolayers and substrate. UXRD in principle selectively measures the lattice motion occurring with a specific wavevector, however, each Bragg reflection only measures the amplitude of a delocalized phonon mode in a spatially localized region, determined by the nanocomposition of the sample or the extinction depth of X-rays. This leads to a decay of experimental signals although the excited modes survive.},
  author       = {Herzog, M. and Schick, D. and Gaal, P. and Shayduk, R. and von Korff Schmising, Clemens and Bargheer, M.},
  issn         = {1432-0630},
  language     = {eng},
  number       = {3},
  pages        = {489--499},
  publisher    = {Springer},
  series       = {Applied Physics A: Materials Science & Processing},
  title        = {Analysis of ultrafast X-ray diffraction data in a linear-chain model of the lattice dynamics},
  url          = {http://dx.doi.org/10.1007/s00339-011-6719-z},
  volume       = {106},
  year         = {2012},
}