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Transverse electron beam imaging system using visible synchrotron radiation at MAX III

Rosborg, Anders LU ; Wallén, Erik LU and Andersson, Åke LU (2012) In Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment 671. p.94-102
Abstract
The diagnostic beam line at the MAX III synchrotron light source utilizes the synchrotron radiation (SR) in the visible to ultraviolet range to form images of the transverse electron beam profile. The emission and subsequent propagation and focusing of the SR is modeled, taking into account effects such as diffraction and the longitudinally distributed SR generation. A detailed description of the setup of the beam line and method used to determine the transverse beam profile is given in the paper. In order to investigate the imaging method, a series of measurements were performed where the beam line configuration was varied to utilize different wavelengths and polarizations of the SR and different horizontal opening angles of the... (More)
The diagnostic beam line at the MAX III synchrotron light source utilizes the synchrotron radiation (SR) in the visible to ultraviolet range to form images of the transverse electron beam profile. The emission and subsequent propagation and focusing of the SR is modeled, taking into account effects such as diffraction and the longitudinally distributed SR generation. A detailed description of the setup of the beam line and method used to determine the transverse beam profile is given in the paper. In order to investigate the imaging method, a series of measurements were performed where the beam line configuration was varied to utilize different wavelengths and polarizations of the SR and different horizontal opening angles of the measurement system. A suggestion is made how to measure future small horizontal beam sizes. (C) 2011 Elsevier B.V. All rights reserved. (Less)
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Electron beam profile, Synchrotron radiation
in
Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
volume
671
pages
94 - 102
publisher
Elsevier
external identifiers
  • wos:000301474600011
  • scopus:84855765312
ISSN
0167-5087
DOI
10.1016/j.nima.2011.12.100
language
English
LU publication?
yes
id
f2b3d2e0-93a9-43da-9433-0196447d03d5 (old id 2571617)
date added to LUP
2012-06-04 11:34:35
date last changed
2017-01-01 06:07:59
@article{f2b3d2e0-93a9-43da-9433-0196447d03d5,
  abstract     = {The diagnostic beam line at the MAX III synchrotron light source utilizes the synchrotron radiation (SR) in the visible to ultraviolet range to form images of the transverse electron beam profile. The emission and subsequent propagation and focusing of the SR is modeled, taking into account effects such as diffraction and the longitudinally distributed SR generation. A detailed description of the setup of the beam line and method used to determine the transverse beam profile is given in the paper. In order to investigate the imaging method, a series of measurements were performed where the beam line configuration was varied to utilize different wavelengths and polarizations of the SR and different horizontal opening angles of the measurement system. A suggestion is made how to measure future small horizontal beam sizes. (C) 2011 Elsevier B.V. All rights reserved.},
  author       = {Rosborg, Anders and Wallén, Erik and Andersson, Åke},
  issn         = {0167-5087},
  keyword      = {Electron beam profile,Synchrotron radiation},
  language     = {eng},
  pages        = {94--102},
  publisher    = {Elsevier},
  series       = {Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment},
  title        = {Transverse electron beam imaging system using visible synchrotron radiation at MAX III},
  url          = {http://dx.doi.org/10.1016/j.nima.2011.12.100},
  volume       = {671},
  year         = {2012},
}