X-ray-emission-threshold-electron coincidence spectroscopy
(2004) In Journal of Electron Spectroscopy and Related Phenomena 141(2-3). p.161-170- Abstract
- Using a penetration-field threshold photoelectron (TPE) analyzer and efficient photon detectors X-ray-emission-threshold-electron coincidence (XETECO) spectroscopy has been developed to a point where peak shape analysis becomes meaningful. The spectra can, on the present level of accuracy, be interpreted as conventional TPE spectra free from post collision interaction effects. For the neon atom and the nitrogen molecule we find a detailed correspondence with state-of-the-art photoemission spectra, both regarding peak positions, line shapes, and relative intensities. Intensity redistribution due to fast core vacancy rearrangement processes in systems with close-lying core levels, like O-2, N2O, and NO is briefly discussed. It is... (More)
- Using a penetration-field threshold photoelectron (TPE) analyzer and efficient photon detectors X-ray-emission-threshold-electron coincidence (XETECO) spectroscopy has been developed to a point where peak shape analysis becomes meaningful. The spectra can, on the present level of accuracy, be interpreted as conventional TPE spectra free from post collision interaction effects. For the neon atom and the nitrogen molecule we find a detailed correspondence with state-of-the-art photoemission spectra, both regarding peak positions, line shapes, and relative intensities. Intensity redistribution due to fast core vacancy rearrangement processes in systems with close-lying core levels, like O-2, N2O, and NO is briefly discussed. It is demonstrated that even the complex threshold behavior at the F K threshold in SF6 leads to a well-defined XETECO peak, directly corresponding to classical photoemission results. (C) 2004 Elsevier B.V. All rights reserved. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/259615
- author
- Soderstrom, J ; Alagia, M ; Richter, R ; Stranges, S ; Agaker, M ; Strom, M ; Ristinmaa Sörensen, Stacey LU and Rubensson, JE
- organization
- publishing date
- 2004
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- threshold behavior, X-ray emission, photoelectrons, coincidence, gas-phase
- in
- Journal of Electron Spectroscopy and Related Phenomena
- volume
- 141
- issue
- 2-3
- pages
- 161 - 170
- publisher
- Elsevier
- external identifiers
-
- wos:000225473400010
- scopus:8344244422
- ISSN
- 0368-2048
- DOI
- 10.1016/j.elspec.2004.06.006
- language
- English
- LU publication?
- yes
- id
- 93cc02a5-13d8-4f31-ae9c-8503b8519d56 (old id 259615)
- date added to LUP
- 2016-04-01 16:06:23
- date last changed
- 2024-04-19 11:08:08
@article{93cc02a5-13d8-4f31-ae9c-8503b8519d56, abstract = {{Using a penetration-field threshold photoelectron (TPE) analyzer and efficient photon detectors X-ray-emission-threshold-electron coincidence (XETECO) spectroscopy has been developed to a point where peak shape analysis becomes meaningful. The spectra can, on the present level of accuracy, be interpreted as conventional TPE spectra free from post collision interaction effects. For the neon atom and the nitrogen molecule we find a detailed correspondence with state-of-the-art photoemission spectra, both regarding peak positions, line shapes, and relative intensities. Intensity redistribution due to fast core vacancy rearrangement processes in systems with close-lying core levels, like O-2, N2O, and NO is briefly discussed. It is demonstrated that even the complex threshold behavior at the F K threshold in SF6 leads to a well-defined XETECO peak, directly corresponding to classical photoemission results. (C) 2004 Elsevier B.V. All rights reserved.}}, author = {{Soderstrom, J and Alagia, M and Richter, R and Stranges, S and Agaker, M and Strom, M and Ristinmaa Sörensen, Stacey and Rubensson, JE}}, issn = {{0368-2048}}, keywords = {{threshold behavior; X-ray emission; photoelectrons; coincidence; gas-phase}}, language = {{eng}}, number = {{2-3}}, pages = {{161--170}}, publisher = {{Elsevier}}, series = {{Journal of Electron Spectroscopy and Related Phenomena}}, title = {{X-ray-emission-threshold-electron coincidence spectroscopy}}, url = {{http://dx.doi.org/10.1016/j.elspec.2004.06.006}}, doi = {{10.1016/j.elspec.2004.06.006}}, volume = {{141}}, year = {{2004}}, }