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X-ray-emission-threshold-electron coincidence spectroscopy

Soderstrom, J ; Alagia, M ; Richter, R ; Stranges, S ; Agaker, M ; Strom, M ; Ristinmaa Sörensen, Stacey LU and Rubensson, JE (2004) In Journal of Electron Spectroscopy and Related Phenomena 141(2-3). p.161-170
Abstract
Using a penetration-field threshold photoelectron (TPE) analyzer and efficient photon detectors X-ray-emission-threshold-electron coincidence (XETECO) spectroscopy has been developed to a point where peak shape analysis becomes meaningful. The spectra can, on the present level of accuracy, be interpreted as conventional TPE spectra free from post collision interaction effects. For the neon atom and the nitrogen molecule we find a detailed correspondence with state-of-the-art photoemission spectra, both regarding peak positions, line shapes, and relative intensities. Intensity redistribution due to fast core vacancy rearrangement processes in systems with close-lying core levels, like O-2, N2O, and NO is briefly discussed. It is... (More)
Using a penetration-field threshold photoelectron (TPE) analyzer and efficient photon detectors X-ray-emission-threshold-electron coincidence (XETECO) spectroscopy has been developed to a point where peak shape analysis becomes meaningful. The spectra can, on the present level of accuracy, be interpreted as conventional TPE spectra free from post collision interaction effects. For the neon atom and the nitrogen molecule we find a detailed correspondence with state-of-the-art photoemission spectra, both regarding peak positions, line shapes, and relative intensities. Intensity redistribution due to fast core vacancy rearrangement processes in systems with close-lying core levels, like O-2, N2O, and NO is briefly discussed. It is demonstrated that even the complex threshold behavior at the F K threshold in SF6 leads to a well-defined XETECO peak, directly corresponding to classical photoemission results. (C) 2004 Elsevier B.V. All rights reserved. (Less)
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author
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organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
threshold behavior, X-ray emission, photoelectrons, coincidence, gas-phase
in
Journal of Electron Spectroscopy and Related Phenomena
volume
141
issue
2-3
pages
161 - 170
publisher
Elsevier
external identifiers
  • wos:000225473400010
  • scopus:8344244422
ISSN
0368-2048
DOI
10.1016/j.elspec.2004.06.006
language
English
LU publication?
yes
id
93cc02a5-13d8-4f31-ae9c-8503b8519d56 (old id 259615)
date added to LUP
2016-04-01 16:06:23
date last changed
2022-01-28 17:22:39
@article{93cc02a5-13d8-4f31-ae9c-8503b8519d56,
  abstract     = {{Using a penetration-field threshold photoelectron (TPE) analyzer and efficient photon detectors X-ray-emission-threshold-electron coincidence (XETECO) spectroscopy has been developed to a point where peak shape analysis becomes meaningful. The spectra can, on the present level of accuracy, be interpreted as conventional TPE spectra free from post collision interaction effects. For the neon atom and the nitrogen molecule we find a detailed correspondence with state-of-the-art photoemission spectra, both regarding peak positions, line shapes, and relative intensities. Intensity redistribution due to fast core vacancy rearrangement processes in systems with close-lying core levels, like O-2, N2O, and NO is briefly discussed. It is demonstrated that even the complex threshold behavior at the F K threshold in SF6 leads to a well-defined XETECO peak, directly corresponding to classical photoemission results. (C) 2004 Elsevier B.V. All rights reserved.}},
  author       = {{Soderstrom, J and Alagia, M and Richter, R and Stranges, S and Agaker, M and Strom, M and Ristinmaa Sörensen, Stacey and Rubensson, JE}},
  issn         = {{0368-2048}},
  keywords     = {{threshold behavior; X-ray emission; photoelectrons; coincidence; gas-phase}},
  language     = {{eng}},
  number       = {{2-3}},
  pages        = {{161--170}},
  publisher    = {{Elsevier}},
  series       = {{Journal of Electron Spectroscopy and Related Phenomena}},
  title        = {{X-ray-emission-threshold-electron coincidence spectroscopy}},
  url          = {{http://dx.doi.org/10.1016/j.elspec.2004.06.006}},
  doi          = {{10.1016/j.elspec.2004.06.006}},
  volume       = {{141}},
  year         = {{2004}},
}