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Model-free classification of X-ray scattering signals applied to image segmentation

Lutz-Bueno, V; Arboleda, C; Leu, L; Blunt, MJ; Busch, A; Georgiadis, A; Bertier, P; Schmatz, J; Varga, Z and Villanueva-Perez, P LU (2018) In Journal of Applied Crystallography 51(5).
Please use this url to cite or link to this publication:
author
publishing date
type
Contribution to journal
publication status
published
in
Journal of Applied Crystallography
volume
51
issue
5
publisher
International Union of Crystallography
external identifiers
  • scopus:85054054180
ISSN
1600-5767
DOI
10.1107/S1600576718011032
language
Unknown
LU publication?
no
id
274626c1-ab50-4884-9429-645014235b32
date added to LUP
2019-03-29 17:10:39
date last changed
2019-06-25 03:51:07
@article{274626c1-ab50-4884-9429-645014235b32,
  author       = {Lutz-Bueno, V and Arboleda, C and Leu, L and Blunt, MJ and Busch, A and Georgiadis, A and Bertier, P and Schmatz, J and Varga, Z and Villanueva-Perez, P},
  issn         = {1600-5767},
  language     = {und},
  number       = {5},
  publisher    = {International Union of Crystallography},
  series       = {Journal of Applied Crystallography},
  title        = {Model-free classification of X-ray scattering signals applied to image segmentation},
  url          = {http://dx.doi.org/10.1107/S1600576718011032},
  volume       = {51},
  year         = {2018},
}