Microstructural degradation of silicon electrodes during lithiation observed via operando X-ray tomographic imaging
Taiwo, Oluwadamilola O. ; Heenan, Thomas M M ; Finegan, Donal P ; Paz-García, Juan M. LU ; Hall, Stephen A. LU ; Mokso, Rajmund LU ; Villanueva-Pérez, Pablo LU
; Patera, Alessandra
; Brett, Daniel J L
and Shearing, Paul R.
(2017)
In Journal of Power Sources
342.
p.904-912
- Abstract
Due to their high theoretical capacity compared to that of state-of-the-art graphite-based electrodes, silicon electrodes have gained much research focus for use in the development of next generation lithium-ion batteries. However, a major drawback of silicon as an electrode material is that it suffers from particle fracturing due to huge volume expansion during electrochemical cycling, thus limiting commercialization of such electrodes. Understanding the role of material microstructure in electrode degradation will be instrumental in the design of stable silicon electrodes. Here, we demonstrate the application of synchrotron-based X-ray tomographic microscopy to capture and track microstructural evolution, phase transformation and... (More)
Due to their high theoretical capacity compared to that of state-of-the-art graphite-based electrodes, silicon electrodes have gained much research focus for use in the development of next generation lithium-ion batteries. However, a major drawback of silicon as an electrode material is that it suffers from particle fracturing due to huge volume expansion during electrochemical cycling, thus limiting commercialization of such electrodes. Understanding the role of material microstructure in electrode degradation will be instrumental in the design of stable silicon electrodes. Here, we demonstrate the application of synchrotron-based X-ray tomographic microscopy to capture and track microstructural evolution, phase transformation and fracturing within a silicon-based electrode during electrochemical lithiation.
(Less)
- author
- Taiwo, Oluwadamilola O.
; Heenan, Thomas M M
; Finegan, Donal P
; Paz-García, Juan M.
LU
; Hall, Stephen A.
LU
; Mokso, Rajmund
LU
; Villanueva-Pérez, Pablo
LU
; Patera, Alessandra
; Brett, Daniel J L
and Shearing, Paul R.
- organization
- publishing date
- 2017-02-28
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- Degradation, Lithiation, Particle fracturing, Silicon electrode, X-ray CT
- in
- Journal of Power Sources
- volume
- 342
- pages
- 9 pages
- publisher
- Elsevier
- external identifiers
-
- scopus:85008711877
- wos:000396186300103
- ISSN
- 0378-7753
- DOI
- 10.1016/j.jpowsour.2016.12.070
- language
- English
- LU publication?
- yes
- id
- 27bc37c0-2157-4688-af5d-dbee857f0bc7
- date added to LUP
- 2017-02-03 09:57:54
- date last changed
- 2025-01-07 05:53:23
@article{27bc37c0-2157-4688-af5d-dbee857f0bc7,
abstract = {{<p>Due to their high theoretical capacity compared to that of state-of-the-art graphite-based electrodes, silicon electrodes have gained much research focus for use in the development of next generation lithium-ion batteries. However, a major drawback of silicon as an electrode material is that it suffers from particle fracturing due to huge volume expansion during electrochemical cycling, thus limiting commercialization of such electrodes. Understanding the role of material microstructure in electrode degradation will be instrumental in the design of stable silicon electrodes. Here, we demonstrate the application of synchrotron-based X-ray tomographic microscopy to capture and track microstructural evolution, phase transformation and fracturing within a silicon-based electrode during electrochemical lithiation.</p>}},
author = {{Taiwo, Oluwadamilola O. and Heenan, Thomas M M and Finegan, Donal P and Paz-García, Juan M. and Hall, Stephen A. and Mokso, Rajmund and Villanueva-Pérez, Pablo and Patera, Alessandra and Brett, Daniel J L and Shearing, Paul R.}},
issn = {{0378-7753}},
keywords = {{Degradation; Lithiation; Particle fracturing; Silicon electrode; X-ray CT}},
language = {{eng}},
month = {{02}},
pages = {{904--912}},
publisher = {{Elsevier}},
series = {{Journal of Power Sources}},
title = {{Microstructural degradation of silicon electrodes during lithiation observed via operando X-ray tomographic imaging}},
url = {{http://dx.doi.org/10.1016/j.jpowsour.2016.12.070}},
doi = {{10.1016/j.jpowsour.2016.12.070}},
volume = {{342}},
year = {{2017}},
}