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Nanotomography of Inverse Photonic Crystals Using Zernike Phase Contrast

Flenner, Silja ; Larsson, Emanuel LU ; Furlan, Kaline ; Laipple, Daniel ; Storm, Malte ; Wilde, Fabian ; Blick, Robert ; Schneider, Gerold A. ; Zierold, Robert and Janssen, Rolf , et al. (2018) 14th International Conference on X-ray Microscopy In Microscopy and Microanalysis 24(S2). p.146-147
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publishing date
type
Contribution to journal
publication status
published
subject
in
Microscopy and Microanalysis
volume
24
issue
S2
pages
2 pages
publisher
Cambridge University Press
conference name
14th International Conference on X-ray Microscopy
conference location
Saskatoon, Saskatchewan, Canada
conference dates
2018-08-19 - 2018-08-24
ISSN
1431-9276
DOI
10.1017/S1431927618013120
language
English
LU publication?
no
id
2d4d2f18-a187-4ecf-8fc8-6a77ce772be9
date added to LUP
2020-09-15 10:23:24
date last changed
2020-09-15 10:23:24
@article{2d4d2f18-a187-4ecf-8fc8-6a77ce772be9,
  author       = {Flenner, Silja and Larsson, Emanuel and Furlan, Kaline and Laipple, Daniel and Storm, Malte and Wilde, Fabian and Blick, Robert and Schneider, Gerold A. and Zierold, Robert and Janssen, Rolf and David, Christian and Beckmann, Felix and Muller, Martin and Greving, Imke},
  issn         = {1431-9276},
  language     = {eng},
  number       = {S2},
  pages        = {146--147},
  publisher    = {Cambridge University Press},
  series       = {Microscopy and Microanalysis},
  title        = {Nanotomography of Inverse Photonic Crystals Using Zernike Phase Contrast},
  url          = {http://dx.doi.org/10.1017/S1431927618013120},
  doi          = {10.1017/S1431927618013120},
  volume       = {24},
  year         = {2018},
}